Noise eXtended Technologies (Noise XT) introduced the NXA Series, a new family of phase noise analyzers. Noise XT exhibited the new product line for the first time at IMS 2012.
The NXA Series simplifies phase noise testing by incorporating a completely new one-box system design. With a category-leading 14-inch touch screen and a redesigned user interface, phase noise measurement is now faster and easier. The NXA Series offers the industry's lowest residual noise performance by using dual channel architecture to cancel its internal noise floor. The NXA Series is available in three models: NXA-6 (up to 6 GHz), NXA-26 (up to 26 GHz), and NXA-50 (up to 50 GHz).
Noise XT products are used throughout the world for high-performance phase noise and jitter-sensitive applications such as ultra-low noise OCXO, surface acoustic wave oscillators (SAW), and optical-electrical-optical (OEO) microwave oscillators; RF and microwave amplifiers; pulsed microwave for radar; low-noise synthesizer design; and other demanding noise applications.
NXA Series features industry's lowest noise floor
The NXA Series measures absolute phase noise and residual phase noise. Options are available for amplitude noise and measurement of phase and amplitude noise on pulsed signals. Combined with very close-to-the-carrier analysis, the NXA is the most complete noise analyzer on the market today.
The NXA is designed with a two-channel phase and amplitude noise analyzer using cross-correlation to cancel its own internal noise. The resulting tests are similar to comparing the output of two separate systems, while displaying only the similarities and rejecting the differences. The residual noise measurement mode includes all the necessary functions to automatically measure noise on 2-port devices with an external phase shifter, either in RF or microwave frequencies.
An additional feature is the ability to eliminate most FFT noise, allowing much better precision compared to the 7-8 dB trace thickness that is typical in competitive products.
Posted by Sara Cohen, Editorial Intern
July 2, 2012