Altair Semiconductor, a 4G chip company developing the world’s most advanced mobile semiconductors for handheld devices, and Aeroflex, the leading global provider of Long Term Evolution (LTE) test equipment, today announced a joint LTE collaboration.

Through the collaboration, Altair and Aeroflex will perform interoperability testing (IOT) to enable joint customer development and testing on a pre-tested and qualified User Equipment (UE) test setup. Following an intensive evaluation period Altair has ordered multiple 7100 LTE digital radio test sets from Aeroflex, with the first delivery in January 2010.

For several months, Altair and Aeroflex have collaborated on IOT of their respective products - Aeroflex’s 7100 digital radio test set, and Altair’s recently announced FourGee™ LTE USB ExpressCard UE. Altair’s LTE data card has also undergone extensive IOT with additional partners and vendors and is currently being used in various field activities.

“Altair’s collaboration with Aeroflex is not only beneficial for both organizations but, more importantly, brings tremendous value to our customers and partners,” said Eran Eshed, co-founder and vice president of marketing and business development for Altair Semiconductor.

“Companies developing products based on Altair’s LTE chips and software and using Aeroflex test equipment will find using the Aeroflex 7100 extremely useful and easy. We had already done all of the prep work to ensure a seamless integration. As LTE expands on a global scale, we look forward to further expanding our collaboration with Aeroflex.”

Altair’s FourGee™ LTE USB ExpressCard UE is one of the industry’s first Category-3 data card solutions. Based on Altair’s FourGee-3100/6200 baseband/RFIC LTE chipset, the ExpressCard is an appropriate test and IOT UE platform for system vendors and carriers involved in the development, trialing, and deployment of LTE systems.

The FourGee™ LTE USB ExpressCard UE is also a reference design for terminal manufacturers working to develop commercial products based on the FourGee™ family of LTE chips.

Based on Aeroflex’s tried and tested RF and baseband technology, the 7100 Series digital radio test set is unique in its support of both RF parametric and protocol testing for LTE terminal devices.

The 7100 Series simulates a network from the physical layer to the core network IP infrastructure. Focused on the R&D market—from components to handsets—the Aeroflex 7100 Series is a comprehensive test system for LTE mobile devices incorporated into a small footprint, single bench-top instrument.