Tektronix, Inc. introduces the 3rd generation of its proven DDR analysis software (opt. DDRA) for the DPO/DSA70000B Series and DPO7000 Series Oscilloscopes.

The Tektronix DDR test solution supports all speeds of DDR, DDR 2, DDR 3, LP-DDR and GDDR3 and spans both PHY layer and digital domains. The company also announced improved connectivity with a new set of Nexus Technology Ball Grid Array (BGA ) Component Interposers for DDR Memory designs.

The Tektronix portfolio of Logic Analyzers, Oscilloscopes and Probing Systems form the core of a critical test bench for design and test engineers working with DDR.

The DDR 3 standard supports data rates of 800 mega transfers per second (MT/s) to 2133 MT/s with clock frequencies of 400 MHz to 1066 MHz respectively, double the speed of DDR 2 technology.

DDR 3 is ideal for high-performance applications such as file servers, video on demand, encoding and decoding, gaming, and 3-D visualization.

The Tektronix DDR Analysis software (opt. DDRA) for the DPO/DSA70000B Series and DPO7000 Series Oscilloscopes adds critical specification validation measurements that are not available on competing test solutions.

The JEDEC specifications for DDR 2 and DDR 3 (JESD79-3C, JESD79-2E) stipulate that pass/fail limits for measurements such as Setup and Hold should be de-rated based on the measured slew rates of the associated signals. Option DDRA now not only offers the needed slew rate measurements, but also performs the de-rating calculation and automatically adjusts the pass/fail limits.

The new BGA component interposers for oscilloscopes and logic analyzers use an innovative socketed design that offers easy installation on the customer’s board and the ability to easily change the memory component for characterization/margin testing. This eliminates the need to send the board to a rework house thus avoiding down time and reducing development cycles.