Keithley introduces a packaged, ready-to-run parametric test system. The model S470 is optimized for production testing of 200 mm wafers at the 130 nm CMOS node and beyond. The system takes a range of I-V and C-V measurements on CMOS, bipolar, and GaAs ICs, including automotive and telecom ICs, LCDs, and more. The design is based on the UNIX-based Model S400 Series testers. The application software is the latest version of the Keithley Test Environment (KTE v5.1), with a test executive and operator interface common to other model S400 series testers. This simplifies migration of test programs and is supported by regular system upgrades for maximum hardware and software reuse. The system comes in a 24-pin configuration, including probe card adapter and cabling, with full guarding and Kelvin connections to the probe needles. The base system includes four DC I-V source-measure units, 100 kHz capacitance/conductance meter, picoammeter, and system reference unit with calibration and diagnostics software.
Keithley Instruments, Inc.