Keithley introduces the S630DC/RF parametric testers with 40 GHz RF measurement capabilities. RF connections are designed into the test head and use per-pin electronics to achieve precision and reliability. The system incorporates a vector network analyzer and DC/RF probe card technology. The inherent DC resolution is 100 aA and 100 nV. This system also supports 300 mm automation standards, and is compatible with both 200 and 300 mm probers. Test results can be imported into a variety of device modeling packages, such as BSIMPro, IC-CAP and UTMOST. The KTE USERLIB macros calculate s-parameters and perform standard reductions of s-parameters to RF parameters.
www.keithley.com; (888) 534-8453