The Multicontact Eye-Pass Probe provides controlled impedance power connections enabling functional test of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment.
This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head. Available contact types are ground, logic, standard and Eye-Pass power supply, power supply sense, and ac signal. The probe design is customized for the particular customer application.
Ruggedly mounted power bypass components are provided for each contacting finger ensuring lowest high frequency inductance by minimizing the distance from the probe tip to the first capacitor.