National Instruments introduced test solutions for 802.11ac WLAN and Bluetooth low-energy technology that combine NI graphical system design software and modular, FPGA-based PXI instrumentation to provide high-performance test capabilities that are completely user-programmable. These test solutions along with other cellular, navigation and wireless connectivity solutions from NI, help engineers thoroughly test their devices on a single high-performance platform.
“Using the software-designed vector signal transceiver and the WLAN measurement suite, we improved our test speeds by more than 200 times compared to traditional rack-and-stack instruments while also significantly improving test coverage,” said Doug Johnson, director of engineering at Qualcomm Atheros.
· Ideal for characterization and production test with best-in-class RMS EVM of -46 dB for 256 QAM
· Ability to perform measurements and custom algorithms in the onboard FPGA of the NI PXIe-5644R VST  for faster measurements and real-time test
Readers can learn more with these resources:
· NI PXI Express Product Page: www.ni.com/80211ac 
· White Paper: http://www.ni.com/white-paper/14058/en 
Web: www.ni.com 
August 27, 2012