Published on Wireless Design and Development (https://www.wirelessdesignmag.com)

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Semiautomatic Probe System

SUSS MicroTec AG introduces the BlueRay Semiautomatic Wafer Probe System. With the BlueRay's z-axis accuracy, it is now possible to be fully confident in test results from both wafers and other substrates. The BlueRay's precision guarantees a safe, repeatable electric contact with the device under test (DUT), which reduces pad damage and eliminates the need for probe mark inspection.


Suss MicroTec AG


Content Item Type: 
Product Announcement [1]
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http://www.wirelessdesignmag.com/product-releases/2005/09/semiautomatic-probe-system
Summary: 
SUSS MicroTec AG introduces the BlueRay Semiautomatic Wafer Probe System. With the BlueRay's z-axis accuracy, it is now possible to be fully confident in test results from both wafers and other substrates. The BlueRay's precision guarantees a safe, repeatable electric contact with the device under test (DUT), which reduces pad damage and eliminates the need for probe mark inspection....
Legacy NID: 
39 503
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Source URL: https://www.wirelessdesignmag.com/product-releases/2005/09/semiautomatic-probe-system

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[1] https://www.wirelessdesignmag.com/content-item-types/product-announcement