Richardson, TX – Anritsu Company  (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization, as well as solutions for measuring components and subsystems used in radar, high-speed serial, microwave backhaul, wireless network, and other applications.
“Anritsu has a long, rich history of providing the market with innovative microwave test solutions that address the most demanding requirements. We continue that tradition at IMS 2013 by showcasing instrumentation that addresses every phase of a product’s lifecycle – from R&D through manufacturing to deployment and maintenance – and in a variety of applications,” says Donn Mulder, Senior Vice President, Anritsu Company U.S.
VectorStar will be the center of test solutions for many of those applications. For signal integrity engineers, Anritsu will be showing the MS4640A series, which features wide frequency coverage of 70 kHz to 70 GHz, as well as high-accuracy time domain and wide dynamic range, making it the ideal tool to verify signal integrity designs. Its high-quality low-frequency S-parameter data maximize the changes of simulation convergence when using S-parameter derived models.
Anritsu will showcase the ME7838A VectorStar 70 kHz to 110 GHz broadband VNA system at IMS 2013, as well. Semiconductor test engineers who conduct on-wafer measurements will want to see demonstrations on how the ME7838A achieves accurate, stable measurements over extended time periods, allowing engineers to better characterize devices, more confidently set product specifications, and gain higher measurement efficiency, as well as VectorStar’s unique capability to make noise figure measurements to 110 GHz. In addition, there will be a technology showing of a 70 kHz to 145 GHz system.
For conducting pulse measurements in radar applications, Anritsu will show the MG3690C RF/microwave signal generators. Producing 100 ns leveled pulse widths with 10 ns resolution, as well as the ability to generate single, doublet, triplet and quadruplet pulses, the MG3690C features the most comprehensive emulation and testing of high-performance narrow pulse radars. The measurement side will be covered by the ML2495A Wideband Peak Power Meter, which is ideal for measuring fast radar pulses due to its 65 MHz video bandwidth.
Also on display will be the MS2830A Spectrum/Signal Analyzer, which will be used to conduct millimeter wave measurements on a BridgeWave Communications 80 GHz Wireless Ethernet Bridge. The MS2830A offers high dynamic range and low phase noise and supports direct coaxial input of signals up to 43 GHz. Maximum frequency may be extended up to 325 GHz via a range external harmonic mixers. A second test station will demonstrate the ease of performing VCO analysis using the sophisticated signal analysis tools of the MS2830A, which offers 14-bit resolution and a maximum analysis bandwidth of 125 MHz at frequencies up to 43 GHz.
To meet the testing needs of engineers and technicians in the field, Anritsu will display its MS2720T Spectrum Master, MS2038C VNA Master, and S820D Site Master. The MS2720T provides continuous frequency coverage from 9 kHz to 43 GHz and offers performance for the most demanding measurements. The MS2038C is a compact handheld multi-function instrument that allows users to conduct S-parameter measurements and spectrum analysis in the field. Covering 2 MHz to 20.0 GHz, the S820C is the most accurate, reliable and convenient microwave transmission line and antenna analyzer for the installation, verification, troubleshooting, and repair of microwave communication systems.
For more information visit visit www.anritsu.com .
Anritsu Company  (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization...