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What: The Solutions for Testing NFC Devices application note explains how to use an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle. It is the newest in the series of Agilent Power of X application notes created to provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments.

When: Available today
 
Where: To obtain the application note “Solutions for Testing NFC Devices” (5991-2738EN) or other free application notes go to www.agilent.com/find/powerofx , registration is required.

For more information, visit www.agilent.com/find/powerofx

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