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Software Automates In-Circuit Test Coverage Reports

December 20, 2010 8:29 am | Product Releases | Comments

Agilent Technologies Inc. recently introduced a fast and easy-to-use test coverage prediction tool: N1194A Agilent Test Coverage Consultant (ATCC). The ATCC software performs two significant tasks. First, it measures the test coverage of a product after the tests have been developed. Second, it quickly predicts the test coverage of a product based only on the CAD layout files....

LISTED UNDER: Services, Calibration / Test

Wafer-Level Camera Solutions with New Automated Testing Process

December 10, 2010 8:15 am | Product Releases | Comments

Nemotek Technologie recently announced the integration of new fully automated testing systems to its manufacturing process. The automatic testing procedure now improves efficiency and reduces time-to-market for Nemotek’s customizable wafer-level solutions, including wafer-level optics (WLO), wafer-level packaging (WLP) and wafer-level cameras (WLC)....

LISTED UNDER: Services, Calibration / Test

High Pass Filters Designed for Test and Lab Use

November 24, 2010 7:00 am | Product Releases | Comments

Crystek has introduced a new line of High Pass Filters, designated the CHPFL Series. Encased in a rugged SMA housing, this filter line is designed for test equipment and general lab use. Five models, with frequency ranges from DC to 100 MHz through 1 GHz, compose the CHPFL line.<br><br> The Crystek CHPFL High Pass Filter line has excellent out-of-band rejection, and features 7th Order Butterworth Response and 50 ohm SMA conne...

LISTED UNDER: Services, Calibration / Test | Filters, IC
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Modular PXI Voltage/Current Source Solution Reduces Test Time

November 24, 2010 7:00 am | Product Releases | Comments

Agilent Technologies Inc. recently introduced the Agilent M9186A PXI isolated single-channel voltage/current source, a modular voltage-current source for use in automotive electronics test applications. The modular PXI-based solution enables testers to generate a voltage and measurement of the resultant current, or generate a current and measurement of the resultant voltage....

LISTED UNDER: Services, Calibration / Test

High Density 40 Gb/s Multicoax Solution for High-Speed Digital Testing

November 18, 2010 9:36 am | Product Releases | Comments

Richardson Electronics is now supporting the HUBER+SUHNER MXP line of high-speed digital testing components and assemblies. This ganged multicoax solution offers a true 40 Gbps coaxial-to-PCB transition with a very small form factor. Benefits include: * Reliable push-on connector mating; only 18 N Mating Force for 2x8 ganged system....

LISTED UNDER: Services, Calibration / Test

VCO Suited for Satellite Communications and Test & Measurement Applications

November 16, 2010 7:21 am | Product Releases | Comments

Z-Communications, Inc. announces a new RoHS compliant VCO (Voltage-Controlled Oscillator) Model CRO2690A-LF. The CRO2690A-LF operates at 2690 MHz with a tuning voltage range of 0.5 to 4.5 Vdc. This VCO features a typical phase noise of -114 dBc/Hz @ 10 kHz offset and a typical tuning sensitivity of 7 MHz/V.

LISTED UNDER: Services, Calibration / Test

Wideband Attenuators Feature Excellent Linearity for Test Equipment Applications

November 16, 2010 7:21 am | Product Releases | Comments

Hittite Microwave Corporation announces three new SMT packaged high linearity 1-bit Digital Attenuators which are ideal for automotive, broadband, cellular/3G, WiMAX/4G, military and test & measurement equipment applications from DC to 10 GHz. The HMC800LP3E, HMC801LP3E and the HMC802LP3E are digitally controlled, 1-bit GaAs MMIC Digital Attenuators which operate from DC to 10 GHz, and provide attenuation levels of 10 dB, 15 dB, and 20 dB respectively.

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COM Express Modules with Latest Intel&reg; Atom Processors

November 16, 2010 7:21 am | Product Releases | Comments

Emerson Network Power, a business of Emerson and the global leader in enabling Business-Critical Continuity today extended its portfolio of small form factor single board computers with the availability of its COMX-430 and COMX-440 COM Express® modules. Powered by the latest Intel® Atom™ D410/D510 processors at 1.

LISTED UNDER: Boards & Modules | Services, Calibration / Test
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Low Pass Filters Designed for Test Equipment and Lab Use

November 11, 2010 7:12 am | Product Releases | Comments

Crystek has introduced the CLPFL Series, a new line of Low Pass Filters. Encased in a rugged SMA housing, this filter line is designed for test equipment and general lab use. Five models, with frequency ranges from DC to 100 through 500 MHz, compose the CLPFL line. The Crystek CLPFL Low Pass Filter line has excellent out-of-band rejection, and features 7th Order Butterworth Response and 50 ohm SMA connectors....

LISTED UNDER: Services, Calibration / Test | Filters, IC

Data Logger with Built-In GPS for Longitudinal Vehicle Dynamics Testing

November 8, 2010 7:19 am | Product Releases | Comments

Kistler announced the North American launch of the industry exclusive Corrsys-Datron Model CDS-GPS, a high-performance data logger with built-in global positioning system (GPS) for longitudinal vehicle dynamics testing applications. Offering full compatibility with other sensors within Kistler’s Corrsys-Datron product range, the CDS-GPS offers an update rate of 100 Hz with GPS signal output via CANBus....

LISTED UNDER: Services, Calibration / Test

Combination of Materials, Fabrication and Test Expertise Deliver LCP Laminates with Exceptional Performance and Proven Reliability

November 4, 2010 9:46 am | Product Releases | Comments

Endicott Interconnect Technologies, Inc. (EI) announced recently that the company has added LCP Laminates to its family of microelectronics packaging product offerings. Custom designed LCP Laminates are suitable for semiconductor packages as LCP coreless designs for up to 6 layers as well as in combination with other rigid materials as hybrid circuits....

LISTED UNDER: Substrates | Services, Calibration / Test

Virtual Drive Test Conversion Tool

October 21, 2010 7:37 am | Product Releases | Comments

Spirent’s Virtual Drive Test (VDT) - Conversion Tool makes it easier than ever to bring a real-world RF environment to your lab bench. The software tool converts RF data captured with a cellular scanner, enabling the data set to be “played back” on Spirent’s SR5500 Wireless Channel Emulator. The tool augments the VDT capabilities built into the SR5500....

LISTED UNDER: Services, Calibration / Test

Test Solution Helps Equipment Developers, Accredited Test Labs, Network Operators Verify LTE Conformance

October 21, 2010 7:37 am | Product Releases | Comments

Agilent Technologies Inc. introduces the Agilent N6070A series signaling conformance test for 3GPP LTE user equipment (UE), which extends the capability of the new Agilent PXT Mobile Communications Test Set to a complete signaling conformance test solution (also known as protocol conformance test or PCT)....

LISTED UNDER: Services, Calibration / Test

National Instruments to Add LTE Automated Test Capabilities to PXI RF Test Portfolio

October 13, 2010 8:10 am | Wireless Design & Development | Product Releases | Comments

National Instruments announced that it will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. NI engineers will demonstrate the new LTE Measurement Suite at the 2010 4G World conference in Chicago on October 20–21....

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Power Meters

Test Set Supports Robust Receiver Designs with Accurate Characterization, Conformance Testing

September 23, 2010 7:58 am | Product Releases | Comments

Agilent Technologies Inc. announced its complete optical receiver stress test solution will be expanded to test 850 nm multimode transceivers. Agilent demonstrated the new optical test solutions at ECOC 2010, Sept. 20 to 22, Torino, Italy, Lingotto Fiere Exhibition Center, Hall 3, Booth 334. The Agilent N4917A optical receiver stress test set provides the most accurate and repeatable conformance and characterization test results....

LISTED UNDER: Services, Calibration / Test

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