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Test Probes

December 2, 2002 9:56 am | Product Releases | Comments

Model 6580 offers a reach up to 24 inches and heat resistant Teflon tubing capable of withstanding contact with very hot surfaces without burning. The test probes are ideal for a variety of field applications up to 60 V DC in hard-to-reach places. Designed with a spring-laded wire locator clamp and screw-in point, the piercing probe allows the user to provide the exact pressure needed to penetrate hard or soft insulation on a wide range of ...

LISTED UNDER: Services, Calibration / Test
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Linear Device Tester

December 2, 2002 9:56 am | Product Releases | Comments

The IC443is a simple-to-use and easy-to-program bench top ICT optimized for 100% testing of linear devices and interfaces directly with handlers and probers for high throughput wafer probing or final assembly testing. The system's low cost, fast set up and simple fill-in-programming make it an ideal tool for high volume production test, incoming sample inspection, and in-depth design verification....

LISTED UNDER: Services, Calibration / Test

Test Cables

December 2, 2002 6:08 am | Product Releases | Comments

Tensolite introduces the Workhorse Test Cable Family. The cables in this family are designed for long life and durability to handle high volume production lines. The Workhorse Series uses Tensolite's 504, 524, and 301 cable, and stainless steel connectors. They are designed to withstand repeated flexing and mating while maintaining phase stability....

LISTED UNDER: Interconnect, Cables | Services, Calibration / Test

SoC Test Cost Reduction Seminars

November 12, 2002 6:06 am | Product Releases | Comments

This seminar is for ASIC/SoC design, test and production engineers and managers. The seminars cover major DFT technologies that reduce SoC test costs and include product demonstrations. The technologies covered in the seminar include: "Virtual" scan for extremely compressed scan-test patterns; True "At-speed" Logic BIST; and Scan-based diagnosis....

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Understanding 802.11a Technology and Testing Requirements - Part II

November 1, 2002 6:41 am | Product Releases | Comments

As WLAN standards emerge, test solutions will play a crucial role in the success of long-term end-user acceptance. By Lisa Ward, Rohde & Schwarz, Matt Maxwell, Tektronix, Inc., and John Bowne, Rohde & Schwarz Editor's Note: This article represents Part Two of a two-part article. Click here to read part one....

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Understanding 802.11a Technology and Testing Requirements

November 1, 2002 6:21 am | Product Releases | Comments

As WLAN standards emerge, test solutions will play a crucial role in the success of long-term end-user acceptance. By Lisa Ward, Rohde & Schwarz, Matt Maxwell, Tektronix, Inc., and John Bowne, Rohde & Schwarz Editor's Note: This article represents Part One of a two-part article. Click here to read part two....

LISTED UNDER: Services, Calibration / Test

Automatic Test System

November 1, 2002 6:09 am | Product Releases | Comments

U-AST is a fully-automated test system that runs industry-standard test cases. The U-ATS also is capable of complete evaluation of WCDMA UE performance. The TestDrive UMTS software in U-ATS is a next-generation test executive that eliminates the need for specialist knowledge of Tree and Tabular Combined Notation (TTCN)....

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Bench Top Tester

November 1, 2002 6:08 am | Product Releases | Comments

The OS-32 Automated Continuity Test System is a self-contained, auto programming test system that gives fast results of shorts and open circuits used to verify the integrity of IC package bond wires, bare and assembled PCBs, and short cable assemblies — instantaneously. The OS-32 system provides 16-bit accuracy on both the source and measurement and fast measurement switching on up to 1000 pins ensuring accurate performance and complete...

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Telecom Education Week

October 10, 2002 6:26 am | Product Releases | Comments

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Microwave Distributors Company

September 27, 2002 7:52 am | Product Releases | Comments

www.microwavedistributors.com/midisco Microwave Distributors Company carries the entire line of MIDISCO Microwave and RF Components, as well as those of other manufacturers, and provides convenient "one-stop" shopping for the busy Design Engineer. The site contains specifications for most available components, including fixed and variable attenuators, terminations, isolators, circulators, couplers, dividers, detectors, lightning protector...

LISTED UNDER: Services, Distributors

Downlink Channel Configuration for W-CDMA Bit Error Rate Testing

September 26, 2002 12:08 pm | Product Releases | Comments

by David J. Schwartz, Agilent Technologies, dave_schwartz @agilent.com The flexibility and complexity of the W-CDMA air interface present special challenges for the performance of Bit Error Rate (BER) testing. BER is the required method for determining the sensitivity of a W-CDMA receiver. The W-CDMA specifications provide a solution in the form of Reference Measurement Channels which, when combined with a properly configured test system...

LISTED UNDER: Services, Calibration / Test

If you build it, you have to test it...

September 12, 2002 10:41 am | Product Releases | Comments

Challenges and solutions in broadband communication systems test. Jack Anderson, Celerity Systems      Some say broadband is like the weather. Everyone talks about it, but no one can do anything about it. Not exactly true. A hot topic in many circles, broadband means different things to different people....

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Test and Measurement Support

September 11, 2002 5:38 am | Product Releases | Comments

Tektronix, Inc announced support for RapidIO. The RapidIO interconnect architecture provides a high-performance standard that optimizes interaction between chip-to-chip and circuit board-to-board. Using the TMS805 RapidIO support package for the TLA family of logic analyzers, developers can acquire and trigger on RapidIO packets, control symbols and transactions in real-time with minimal impact on the system's normal environment, allowing t...

LISTED UNDER: Services, Calibration / Test

Bluetooth Test System

September 11, 2002 5:17 am | Product Releases | Comments

With the ME7865A, chipset developers, module manufacturers, and consumer product developers have a single, cost-effective solution that assures the performance of Bluetooth radios before submission to a Bluetooth Qualification Test Facility (BQTF). The ME7865A addresses all 16 test cases defined in the Bluetooth RF test specification up to 3 GHz....

LISTED UNDER: Services, Calibration / Test

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