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RF Emissions Testing Guide

January 27, 2003 10:31 am | Product Releases | Comments

This comprehensive engineering guide on RF emission testing is a hand reference guide that describes the key aspects of three basic methods used to test EMC emissions in electronics and electrical products, including conducted testing using an AMN/LISN; absorbing clamp testing for disturbance power on connected cables; and radiated emissions testing performed on an open area test site....

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Wireless Test Manager

January 27, 2003 9:47 am | Product Releases | Comments

The N4019A Bluetooth wireless test manager is a software product that enables Bluetooth manufacturers to respond quickly to the demand for wireless devices and modules. When used with the Agilent E1852B Bluetooth test set, the N4019A provides a fast, simple way to make measurements without complex instrument control and measurement programming....

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Survival of the Fittest

January 27, 2003 9:41 am | Product Releases | Comments

Survival of wireless semiconductor suppliers will be determined by how well they know their customers' customers. By Ed Valdez, Motorola Semiconductor Products Sector Know Thy Customer During the last two years, the suppliers at the front end of the wireless consumer value chain have experienced tectonic shifts in the way they have evolved to serve their customers....

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Test Adapter

January 27, 2003 9:34 am | Product Releases | Comments

The Batwing™ enables test engineers to easily connect network analyzer ports to chipsets with closely spaced (0.141 inches) end-launch connectors through 65 GHz. The Batwing test adapters are phase/delay matched and fixed electrical data can be easily added to software error correction models....

LISTED UNDER: Interconnect, Adapters | Services, Calibration / Test

Radio Test Set

January 27, 2003 9:34 am | Product Releases | Comments

Through firmware upgrades, the 2975 radio test set now includes new test patters, the ability to remotely control 2975 tests via the Internet, and the ability to test P25 trunked radios in the 800 MHz band. This remote testing capability allows users to monitor hard-to-reach locations. The 2975 also includes a new feature designed for fast location of harmonics using the instrument's built-in spectrum analyzer....

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IC Test System

January 27, 2003 9:34 am | Product Releases | Comments

The IC240 is a "bare bones" bench top test system that combines a powerful, simple to modify software interface with a configurable hardware core that allow test engineers to easily customize the system for their unique testing applications. The IC240 has a prototyping board that comes with decoder, buffers and software drivers that allow fast bread-boarding for their custom instruments....

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Test Platforms

December 26, 2002 8:57 am | Product Releases | Comments

The TS-5400 Series II Automotive Functional Test Platform (AFTP), is a complete measurement-ready test solution designed to help automotive electronics manufacturers meet time-to-market. The TS-5400 Series II AFTP is a scalable and flexible platform that provides a compatible migration path for product test software....

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R&D Testing Solutions

December 26, 2002 8:45 am | Product Releases | Comments

These new products include a cdma2000 protocol application that runs on Agilent's E6900A wireless protocol test set. Software developers designing embedded applications can use the solution to connect devices to the Internet, analyze active or test data, and verify protocol transmission across the air interface....

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Modular Test System

December 26, 2002 8:45 am | Product Releases | Comments

Model 4500-MTS modular test system is for high speed, high channel count automated test applications. Model 4500-MTS is an open architecture modular test chassis with sufficient power source capability, throughput, and accuracy to lower the cost of manufacturing. Typical applications include testing fiberoptic telecommunication system components and other active optoelectronic devices....

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Test Probes

December 2, 2002 9:56 am | Product Releases | Comments

Model 6580 offers a reach up to 24 inches and heat resistant Teflon tubing capable of withstanding contact with very hot surfaces without burning. The test probes are ideal for a variety of field applications up to 60 V DC in hard-to-reach places. Designed with a spring-laded wire locator clamp and screw-in point, the piercing probe allows the user to provide the exact pressure needed to penetrate hard or soft insulation on a wide range of ...

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Linear Device Tester

December 2, 2002 9:56 am | Product Releases | Comments

The IC443is a simple-to-use and easy-to-program bench top ICT optimized for 100% testing of linear devices and interfaces directly with handlers and probers for high throughput wafer probing or final assembly testing. The system's low cost, fast set up and simple fill-in-programming make it an ideal tool for high volume production test, incoming sample inspection, and in-depth design verification....

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Test Cables

December 2, 2002 6:08 am | Product Releases | Comments

Tensolite introduces the Workhorse Test Cable Family. The cables in this family are designed for long life and durability to handle high volume production lines. The Workhorse Series uses Tensolite's 504, 524, and 301 cable, and stainless steel connectors. They are designed to withstand repeated flexing and mating while maintaining phase stability....

LISTED UNDER: Interconnect, Cables | Services, Calibration / Test

SoC Test Cost Reduction Seminars

November 12, 2002 6:06 am | Product Releases | Comments

This seminar is for ASIC/SoC design, test and production engineers and managers. The seminars cover major DFT technologies that reduce SoC test costs and include product demonstrations. The technologies covered in the seminar include: "Virtual" scan for extremely compressed scan-test patterns; True "At-speed" Logic BIST; and Scan-based diagnosis....

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Understanding 802.11a Technology and Testing Requirements - Part II

November 1, 2002 6:41 am | Product Releases | Comments

As WLAN standards emerge, test solutions will play a crucial role in the success of long-term end-user acceptance. By Lisa Ward, Rohde & Schwarz, Matt Maxwell, Tektronix, Inc., and John Bowne, Rohde & Schwarz Editor's Note: This article represents Part Two of a two-part article. Click here to read part one....

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