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SOC Test Solution

December 23, 2004 8:04 am | Product Releases | Comments

Agilent introduces an automated test solution for functional, at-speed test for testing high-speed, system-on-a-chip (SOC) devices. Part of the Agilent 93000 SOC Series, this high-speed I/O solution enables functional testing of high-pin-count devices, such as next-generation PC chipsets up to speeds of 3....

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Conformance Testing

December 23, 2004 8:04 am | Product Releases | Comments

VeriWave announces automated conformance tests for IEEE 802.11 APs (Access Points) and clients. The test suites execute on VeriWave's WaveTest™ Traffic Generator/Performance Analyzer. The two conformance test suites address the complexity associated with the development of 802.11 devices. The Client UNH-IOL 802....

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Wireless Laptop Test Solution

December 23, 2004 7:57 am | Product Releases | Comments

Azimuth Systems announces its W-Series wireless laptop test solution that allows the performance and scalability of laptop PCs with embedded wireless communications to be automatically validated. The laptop test solution extends the Azimuth W-Series , the industry's first Wireless LAN testing platform, by incorporating standard, off-the-shelf laptops with embedded Wi-Fi into the standard testing process....

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Managing RFIC Test Challenges for WLAN Services

December 23, 2004 7:33 am | by Cost-effective, high-performance, reconfigurable test systems are the mantra for next generation WLAN RF components. John Lukez | Product Releases | Comments

The rapid growth of WLAN systems has created extraordinary challenges for RFIC testing. The emergence of WLAN standards is driving key performance characteristics such as channel bandwidths and data rates to unprecedented levels. To meet evolving requirements in WLAN and communications services, IC manufacturers need cost-effective, high-performance ATE systems that are easily upgradeable, maintain high-accuracy, and boost test throughput....

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Automated Test Solution

December 16, 2004 6:38 am | Product Releases | Comments

Agilent introduces an automated test solution for functional, at-speed test that reduces the cost of testing high-speed, system-on-a-chip (SOC) devices to the lowest in the industry. Part of the Agilent 93000 SOC Series, this complete high-speed I/O solution enables functional testing of high-pin-count devices, such as next-generation PC chipsets up to speeds of 3....

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Wi-Fi Testing Using a Cabled RF Environment

November 23, 2004 11:17 am | Product Releases | Comments

An elegant alternative to homegrown test environments for wireless systems. By Fanny Mlinarsky, Azimuth Systems As Wi-Fi technology matures, wireless LANs are moving from the relatively tolerant SOHO market to the demanding enterprise — a market where high network performance is needed to support mission-critical applications, a large number of network users, and a diversity of network elements....

LISTED UNDER: Interconnect, Cables | Services, Calibration / Test

CDMA Test Solution

October 26, 2004 11:37 am | Product Releases | Comments

Spirent announced the APEX C2K: PoC, a lab-based solution for evaluating performance of Push-to-Talk over Cellular (PoC) handsets for CDMA networks. Spirent's APEX C2K: PoC Application Performance Test System is an automated lab-based performance and protocol analysis system designed to quantify the performance of VoIP PoC handsets....

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Mobile Phone Testing: Striving to Control Test Costs Against the Onslaught of Enhanced User Features

October 21, 2004 11:21 am | Product Releases | Comments

New features, power of the carriers, and lower phone prices are driving the market. By Robert Green Mobile phone manufacturing means one thing: very high volume production. During the last few years, annual production of mobile phones has been around 500 million units. This year, production will be closer to 600 million phones....

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Parametric Test System

September 29, 2004 8:11 am | Product Releases | Comments

Keithley introduces a packaged, ready-to-run parametric test system. The model S470 is optimized for production testing of 200 mm wafers at the 130 nm CMOS node and beyond. The system takes a range of I-V and C-V measurements on CMOS, bipolar, and GaAs ICs, including automotive and telecom ICs, LCDs, and more....

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Test Software Suite

September 29, 2004 8:11 am | Product Releases | Comments

Agilent introduces an enhanced input/output (I/O) library suite that simplifies the process of connecting test instruments to a PC to develop test systems. The E2094N I/O Libraries Suite 14.0 features updated I/O libraries and automated connection tools that detect instruments connected to a PC, configure the interfaces, and verify connection even in test systems that mix Ethernet/LAN, GPIB, RS-232, USB and VXI instruments from multiple ven...

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Testing Capabilities

September 29, 2004 8:04 am | Product Releases | Comments

Agilent introduces wireless test benches, sources and measurement capabilities for its Advanced Design System (ADS) 2004A EDA software that enable simulation of wireless designs to WLAN, 3GPP and TD-SCDMA standards. The capabilities allow RF circuit designers to verify subsystem performance in wireless communications products....

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The Testing Needs of WLAN Technology

August 30, 2004 7:47 am | Product Releases | Comments

In order for Wireless LANs to achieve the performance demanded by corporate buyers, equipment and chipset manufacturers will need better test equipment. By Dr. Thomas Alexander, Rick Denker, and Gerard Goubert Today's WLANs resemble the early days of cell phones, whose first users were driven by the great convenience, and whose later users demanded much more sophisticated features and reliability: the transparent roaming, compact equip...

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Test Devices

August 30, 2004 7:45 am | Product Releases | Comments

Agilent introduces its Versatest Series Model V5400, which delivers testing across a full spectrum of memory devices. The V5400's dynamic algorithmic pattern generator (APG) and patented tester-per-site (TPS) architecture provide configuration flexibility and improvement in throughput for wafer sort and final memory testing....

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Featured Technology The Testing Needs of WLAN Technology

August 30, 2004 7:07 am | Product Releases | Comments

In order for Wireless LANs to achieve the performance demanded by corporate buyers, equipment and chipset manufacturers will need better test equipment. By Dr. Thomas Alexander, Rick Denker, and Gerard Goubert Today's WLANs resemble the early days of cell phones, whose first users were driven by the great convenience, and whose later users demanded much more sophisticated features and reliability: the transparent roaming, compact equipm...

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Semiconductor Test Equipment

August 3, 2004 5:13 am | Product Releases | Comments

Agilent introduces its 41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE), which includes advanced switching matrix technology and a new atto current sense and switch unit (ASU) that enables automation of parametric instruments without compromising measurement performance....

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