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Data Logger with Built-In GPS for Longitudinal Vehicle Dynamics Testing

November 8, 2010 7:19 am | Product Releases | Comments

Kistler announced the North American launch of the industry exclusive Corrsys-Datron Model CDS-GPS, a high-performance data logger with built-in global positioning system (GPS) for longitudinal vehicle dynamics testing applications. Offering full compatibility with other sensors within Kistler’s Corrsys-Datron product range, the CDS-GPS offers an update rate of 100 Hz with GPS signal output via CANBus....

LISTED UNDER: Services, Calibration / Test

Combination of Materials, Fabrication and Test Expertise Deliver LCP Laminates with Exceptional Performance and Proven Reliability

November 4, 2010 9:46 am | Product Releases | Comments

Endicott Interconnect Technologies, Inc. (EI) announced recently that the company has added LCP Laminates to its family of microelectronics packaging product offerings. Custom designed LCP Laminates are suitable for semiconductor packages as LCP coreless designs for up to 6 layers as well as in combination with other rigid materials as hybrid circuits....

LISTED UNDER: Substrates | Services, Calibration / Test

Virtual Drive Test Conversion Tool

October 21, 2010 7:37 am | Product Releases | Comments

Spirent’s Virtual Drive Test (VDT) - Conversion Tool makes it easier than ever to bring a real-world RF environment to your lab bench. The software tool converts RF data captured with a cellular scanner, enabling the data set to be “played back” on Spirent’s SR5500 Wireless Channel Emulator. The tool augments the VDT capabilities built into the SR5500....

LISTED UNDER: Services, Calibration / Test
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Test Solution Helps Equipment Developers, Accredited Test Labs, Network Operators Verify LTE Conformance

October 21, 2010 7:37 am | Product Releases | Comments

Agilent Technologies Inc. introduces the Agilent N6070A series signaling conformance test for 3GPP LTE user equipment (UE), which extends the capability of the new Agilent PXT Mobile Communications Test Set to a complete signaling conformance test solution (also known as protocol conformance test or PCT)....

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National Instruments to Add LTE Automated Test Capabilities to PXI RF Test Portfolio

October 13, 2010 8:10 am | Wireless Design & Development | Product Releases | Comments

National Instruments announced that it will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. NI engineers will demonstrate the new LTE Measurement Suite at the 2010 4G World conference in Chicago on October 20–21....

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Power Meters

Test Set Supports Robust Receiver Designs with Accurate Characterization, Conformance Testing

September 23, 2010 7:58 am | Product Releases | Comments

Agilent Technologies Inc. announced its complete optical receiver stress test solution will be expanded to test 850 nm multimode transceivers. Agilent demonstrated the new optical test solutions at ECOC 2010, Sept. 20 to 22, Torino, Italy, Lingotto Fiere Exhibition Center, Hall 3, Booth 334. The Agilent N4917A optical receiver stress test set provides the most accurate and repeatable conformance and characterization test results....

LISTED UNDER: Services, Calibration / Test

SD UHS-I Card Compliance Test Tools Now Available for Portable Consumer Electronics

September 15, 2010 8:08 am | Product Releases | Comments

Agilent Technologies Inc. announces the industry’s first secure digital ultra-high-speed (SD UHS-I) card compliance test application and a third-party compliance tool. The compliance test package, helps design engineers accelerate the turn-on and debug of SD UHS-I card-based systems used in portable consumer electronics....

LISTED UNDER: Consumer | Services, Calibration / Test

Automated MIPI Compliance Package Addresses Physical and Protocol Layer Test in the Oscilloscope

September 10, 2010 7:36 am | Product Releases | Comments

CHESTNUT RIDGE, N.Y., /PRNewswire/ -- LeCroy announced a comprehensive testing solution for the mobile phone industry specifically targeted to MIPI (Mobile Industry Processor Interface) standards. The MIPI standards are driving the next generation of mobile devices -- allowing for faster data transfer, lower power consumption, and higher resolution displays and cameras....

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Oscilloscopes
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Enhanced Radiated Test System from Teseq Provides More Flexibility

September 1, 2010 9:41 am | Wireless Design & Development | Product Releases | Comments

Teseq Inc. has improved its ITS 6006 (Immunity Test System) for radiated EMC immunity testing by enhancing the RF power meters used in conjunction with the unit. The ITS 6006, ideal for use in a variety of EMC applications including information technology, medical, RF, traffic telematics and mobile communications, features two updated, rugged RF power meter models, the PMR 6006 and PMU 6006, with an expanded frequency range from 1 MHz...

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Power Meters

13 GHz High Speed Logic Ideal for High Volume, Low Jitter Communications, Test & Networking Applications

August 30, 2010 10:40 am | Product Releases | Comments

Hittite Microwave Corporation has released four new high speed logic products to complement its growing high speed logic product line. Operating with clock rates up to 13 GHz, and housed in plastic SMT packages, the HMC720LP3E, HMC721LP3E, HMC722LP3E, and the HMC723LP3E are ideal for deployment in high volume applications ranging from bench test equipment, ATE, optical communications, medical and industrial systems to networking and militar...

LISTED UNDER: Embedded Systems & Networking | Services, Calibration / Test

COM Express Modules with Latest Intel Atom Processors

August 26, 2010 10:10 am | Product Releases | Comments

Emerson Network Power, a business of Emerson and the global leader in enabling Business-Critical Continuity today extended its portfolio of small form factor single board computers with the availability of its COMX-430 and COMX-440 COM Express® modules. Powered by the latest Intel® Atom™ D410/D510 processors at 1....

LISTED UNDER: Boards & Modules | Services, Calibration / Test

SAS Compliance Test Software Provides Automated 6-Gbps and 12-Gbps Measurements for Oscilloscopes

August 25, 2010 9:44 am | Wireless Design & Development | Product Releases | Comments

Agilent Technologies Inc. introduces automated compliance test software for Serial Attached SCSI (SAS) physical-layer transmitter compliance testing that includes measurement support for SAS 6-Gbps and 12-Gbps interfaces. Using the Infiniium 90000 Series or 90000 X-Series oscilloscope and the automated N5412B SAS-2 compliance test software, engineers can maximize their design margins and gain greater insights into their system performan...

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Oscilloscopes | Chipsets, Other

Two-Slot PXI Module Delivers 6 GHz Vector Network Analysis for Precision Automated RF Test

August 4, 2010 9:09 am | Product Releases | Comments

National Instruments announces the NI PXIe-5630 6 GHz two-port vector network analyzer (VNA), the automated test industry’s first VNA available in a compact PXI form factor. With support for full vector analysis of transmission and reflection (T/R) parameters, precision automatic calibration and flexible software-defined architecture, the new VNA is ideally suited for automated design validation and production test....

LISTED UNDER: Services, Calibration / Test

Software Simplifies Bluetooth/WLAN Module Testing

July 26, 2010 10:45 am | Product Releases | Comments

Anritsu Company introduces CombiTest, a PC-based software application that provides remote control of Anritsu’s MT8860x WLAN Test Set and MT8852B Bluetooth Test Set. CombiTest simplifies the creation of test plans to accurately and more efficiently measure the performance of Bluetooth/WLAN combinational modules....

LISTED UNDER: Services, Calibration / Test

Customizable Kit Enables Developers to Build and Test Solar Energy Harvesting Applications Without Designing Any Hardware

July 20, 2010 6:25 am | Product Releases | Comments

CHANDLER, Ariz.--(BUSINESS WIRE) -- Microchip Technology Inc. today announced that it has partnered with Cymbet Corporation to provide the world’s first customizable energy harvesting application development kit - the XLP 16-bit Energy Harvesting Development Kit. This kit includes a modular development board populated with the PIC24F16KA102 microcontroller — featuring eXtreme low power—and the capability to add PICtail™ daughter boards ...

LISTED UNDER: Services, Calibration / Test

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