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Solution for Wafer-Level Testing of MEMs-Based Optical Switches

July 16, 2001 5:44 am | Product Releases | Comments

The integration of the Summit Series wafer probing systems and the Polytec Micro-Scanning Laser Vibrometer (MSV) provides an automated, non-invasive device characterization during the Micro Electromechanical System (MEMs) optical switch manufacturing process. Complete characterization of every MEMS device in an optical switch array is critical to ensure final switch performance....

LISTED UNDER: Switches, IC | Services, Calibration / Test

Test Automation Solution

June 25, 2001 5:04 am | Product Releases | Comments

TestQuest announced the availability of its test automation solution for Handspring™ Visor™ handheld computers, further extending its reach in the handheld computer industry. The new TestQuest Pro System for Handspring builds on the success and extends the functionality of the company's TestQuest Pro System for Palm, the first product to provide complete functional testing for Palm handheld computers....

LISTED UNDER: Services, Calibration / Test

Diagonal Polarized Horn Antenna for Wireless Test Applications

June 20, 2001 5:03 am | Product Releases | Comments

A new diagonal polarized horn antenna specifically designed for wireless test applications was announced by ETS-Lindgren. The antenna has two orthogonally placed feeds for simultaneous measurements in north horizontal and vertical polarizations. Polarization can be either linear or circular. Cross polarization isolation is better than 25 dB....

LISTED UNDER: Services, Calibration / Test
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Solution for Wafer-Level Testing

June 18, 2001 4:56 am | Product Releases | Comments

The integration of the Summit Series wafer probing systems and the Polytec Micro-Scanning Laser Vibrometer (MSV) provides an automated, non-invasive device characterization during the Micro Electromechanical System (MEMs) optical switch manufacturing process. Complete characterization of every MEMS device in an optical switch array is critical to ensure final switch performance....

LISTED UNDER: Services, Calibration / Test

Probe for High Performance Test Sockets

May 30, 2001 12:26 pm | Product Releases | Comments

The Pico Probe is designed for fine pitch test sockets and multiple cycle connectors requiring optimum electrical performance and long life (over 500,000 cycles). The patent pending design mounts on 0.0250 pitch and features a 0.0850 uncompressed length with 0.0220 rated travel resulting in a working length or signal path length of 0....

LISTED UNDER: Services, Calibration / Test

Pulsed Laser Diode Test System

May 30, 2001 11:55 am | Product Releases | Comments

Keithley Instruments announced its Model 2520 Pulsed Laser Diode Test System for electrical characterization of laser diodes in either the chip/bar state or in finished modules. The Model 2520 is the only single-instrument system for testing laser diodes in pulse mode up to 5A peaks. It allows pulse widths as short as 500nS with rise and fall times less than 60nS, while protecting the laser diode with output short and voltage compliance fun...

LISTED UNDER: Services, Calibration / Test

Hand-held ESD Tester

May 30, 2001 11:55 am | Product Releases | Comments

Schaffner EMC, Inc. has introduced a high functionality ESD tester that offers all of the features of a comprehensive ESD test system in a compact, lightweight, hand-held instrument. Ideal for characterization testing of new designs, IEC compliance and pre-compliance testing, QA production testing, and service and repair, the new NSG 435 combines user-friendliness, reliability and repeatability of ESD testing....

LISTED UNDER: Services, Calibration / Test

Test Equipment Catalog

April 30, 2001 8:04 am | Wireless Design & Development | Product Releases | Comments

Gig-tronics has issued a short form catalog featuring its high performance products, including the company's microwave synthesizers, power meters, RF signal generators, and VXI instruments. The catalog provides a quick guide to Giga-tronics' key product features, statistics, and applications. A sensor selection chart is included to help match products to exact measurement requirements....

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Power Meters
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Analyzers With GPRS, HSCSD, and GSM 400 Testing Capability

April 30, 2001 6:15 am | Product Releases | Comments

Anritsu Company introduces GPRS and HSCSD measurement software for its MT8801C and MT8802A Radio Communication Analyzers. This introduction supports GPRS, HSCSD, and GSM 400, as well as major global cellular standards such as GSM 900/1800/1900, PHS, PDC, IS-136, DECT, AMPS, and IS-95 in a single handset tester....

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Analyzers, Spectrum

Protocol Test System

April 30, 2001 6:15 am | Product Releases | Comments

Spirent Communications announced the AirAccess C2K Protocol Test System. AirAccess C2K is a performance analysis solution that aids cdma2000 mobile device manufacturers and service provides in the development and deployment of reliable products and services. AirAccess C2K combines Windows-based application software with powerful instruments to provide complete emulation of a multi-cell cdma2000 network....

LISTED UNDER: Services, Calibration / Test

Single Box L-I-V Test Solution

April 30, 2001 6:15 am | Product Releases | Comments

Keithley announced its Model 2520 Pulsed Laser Diode Test System for electrical characterization of laser diodes in pulse mode up to 5 A peaks. It allows pulse widths as short as 500 nS with rise and fall times less than 60 nS, while protecting the laser diode with output short and voltage compliance functions....

LISTED UNDER: Services, Calibration / Test

Test System Meets Requirements for cdma2000

April 30, 2001 6:15 am | Product Releases | Comments

Spirent Communications announces the introduction of the TAS cdma2000 Interference Lab (TAS CIL). TAS CIL is a powerful test system specifically designed to meet the receiver testing requirements for cdma2000 wireless terminals and base stations. The TAS CIL combines the features of the new TAS5600C Universal Interference Emulator with the impairments found in the TAS4600A Noise & Interference Emulator....

LISTED UNDER: Services, Calibration / Test

Bluetooth Test Set

April 30, 2001 6:15 am | Product Releases | Comments

Anritsu Company introduces the MT8850A Bluetooth™ Test Set that meets the industry's demand for Bluetooth test instrumentation by conducting measurements in accordance with RF Test Specification V0.09 and using the Bluetooth protocol stack for full implementation of test-mode signaling. Combining fast and accurate RF measurement capability with compact size and affordability, the MT8850A is an excellent tool for production test of Bluet...

LISTED UNDER: Services, Calibration / Test

RF Test Interface System

April 30, 2001 6:15 am | Product Releases | Comments

Dow-Key Microwave's newest product is a high power (5001 and 5002) RF Test Interface System developed to support the RF testing of WCDMA base stations. The high power segment of this system is designed to meet a very demanding requirement for passive intermodulation of 110 dBc @ 2 - 20 W. The System routes and conditions RF signals from the inputs and outputs of the DUT (Device Under Test) to the test equipment allowing for test automatio...

LISTED UNDER: Services, Calibration / Test

Connectivity Tester

April 10, 2001 9:59 am | Product Releases | Comments

The NetTool™ Connectivity Tester combines cable, network, and PC configuration testing in a palm-sized tool. It identifies a jack as Ethernet, Phone, Token Ring, or inactive and checks link pulse for speed, polarity, duplex, level information, and receive pair. It resolves complex PC network configuration issues such as IP address, default getaway, and email and web servers, while showing key network resources used by that PC such as se...

LISTED UNDER: Services, Calibration / Test

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