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Test Platform

October 1, 2003 6:12 am | Product Releases | Comments

Tektronix' K15 protocol test platform provides 3G troubleshooting solutions that include application software for real-time multi-interface call trace and automatic lub configuration for UMTS....

LISTED UNDER: Services, Calibration / Test

PXI-based Test Systems

October 1, 2003 6:05 am | Product Releases | Comments

The Aeroflex 3000 series is a PXI-based modular test suite for mobile phone and general-purpose wireless test. The Aeroflex 3000 series includes four PXI modules and supporting applications for signal generation and signal analysis that meet the specific requirements for GSM/EDGE and WCDMA/UMTS mobile phone testing....

LISTED UNDER: Services, Calibration / Test

MATLAB Test and Measurement Applications for Communications

September 18, 2003 9:37 am | Product Releases | Comments

This seminar will cover the design of a communications subsystem using MATLAB(R) and Simulink(R), implementation on an FPGA, and subsystem testing and verification by taking real world measurements and comparing modeled behavior with actual behavior. Engineers from The MathWorks will demonstrate tools that support the communications and electronics design flow, including prototyping designs, modeling system behavior, design verification...

LISTED UNDER: Services, Calibration / Test
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10th Annual International KGD Packaging and Test Workshop

September 18, 2003 9:31 am | Product Releases | Comments

The International KGD Packaging and Test Workshop returns to the Napa Valley this September to build on the progress of the past 10 years and focus on the future of semiconductor die products (bare die, flip chip, and wafer level-CSP). As the microelectronics industry's leading event focusing on KGD packaging, the workshop has charted a decade of progress, from the early emphasis on high performance systems to the current success of lo...

LISTED UNDER: Services, Calibration / Test

Automotive Component Testing

September 2, 2003 8:37 am | Product Releases | Comments

Schaffner has published a wall cart that covers key elements of automotive component testing. The cart includes a variety of diagrams, tables, and ratio charts for RF emissions, direct RF power injection, Bulk Current Injection (BCI), ESD and transients, as well as TEM cell and stripline testing....

LISTED UNDER: Automotive | Automotive | Services, Calibration / Test

On-Wafer Test Solution

July 30, 2003 9:51 am | Product Releases | Comments

Cascade Microtech announces a fully integrated on-wafer device characterization solution that provides measurement accuracy and high performance for characterizing semiconductor devices to 110 GHz. This solution enables high-precision measurements up to 110 GHz by combining the Agilent N5250A 110 GHz PNA series network analyzer with Cascade's Summit series of analytical probing systems....

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Testing Platforms

July 8, 2003 11:09 am | Product Releases | Comments

Racal Instruments has developed quad band functionality within its 6103G digital radio test platform, providing 850, 900, 1800, and 1900 MHz test capability. This will enable users of the 6103 AIME and 6103 AIME/CT to cover all GSM bands using one test platform. Racal has also developed 850 MHz protocol conformance test cases bringing users of the 6103 AIME/CT system quad band conformance testing capabilities....

LISTED UNDER: Services, Calibration / Test

Testers

July 8, 2003 11:09 am | Product Releases | Comments

QuadTech announces that it has added three Hipot testers to its family of Sentry Hipot Testers. The Sentry Plus Series includes three models. The Sentry 10 Plus performs AS Hipot tests over a programmable voltage range from 50 to 5000 V AC with a pass/fail leakage current detection range from 1 μA to 20 mA....

LISTED UNDER: Services, Calibration / Test
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LNA Test Receiver

July 8, 2003 11:09 am | Product Releases | Comments

Spacek Labs receiver model P60-1B is designed for performing noise figure testing of V-Band low-noise amplifiers. The receiver operates over a 10 GHz bandwidth in V-Band with full bandwidth coverage as an option. The LO is derived using a 3X multiplier or with an optional 4X multiplier. The IF covers 10 to 500 MHz....

LISTED UNDER: Services, Calibration / Test

Noise Calibration Standards

July 2, 2003 9:47 am | Product Releases | Comments

Noise Com announces the NBS-Series of broadband Noise Calibration Standards for calibration laboratories, radiometer test and verification, and low noise amplifier tests. Using a low-loss waveguide horn design, Noise Com isolates the cold parts from the waveguide, which is controlled at ambient temperature, and avoids condensation of humidity and errors from temperature gradients....

LISTED UNDER: Services, Calibration / Test | Test and Measurement, Standards / Calibration

The Missing Link: 3G Test Cases for the Deployment of Next-Generation Wireless

May 30, 2003 11:59 am | Product Releases | Comments

By Rob Johnson, Anite Working with TTCN 3G is happening. As the broader market reconciles the overly optimistic expectations of the last several years, the wireless industry is, in fact, proceeding with the launch of next-generation wireless services. The momentum and commitment behind 3G network deployment and terminal development remains strong....

LISTED UNDER: Services, Calibration / Test

Mobile Test Platform

May 30, 2003 11:46 am | Product Releases | Comments

The Seven.Five multigeneration wireless test family is a mobile test platform that is adaptable to any test application. It provides wireless infrastructure analysis, benchmarking, and optimization for 2G, 2.5G, and 3G network deployments. The family consists of Seven.Five Solo, Seven.Five Duo, Seven....

LISTED UNDER: Services, Calibration / Test

Test Solution

May 30, 2003 11:38 am | Product Releases | Comments

The Agilent Signal Studio for 1xEV-DV and cdma200 software (E4438C-414) works with the Agilent E4438C ESG vector signal generator, giving mobile chipset designers a flexible test and verification tool based upon 3GPP2 standards. The software application includes four 1xEV-DV forward link channels: two short-duration, fully coded packet data channels (PDCH) and two real-time packet data control channels (PDCCH), in addition to forward and re...

LISTED UNDER: Services, Calibration / Test

Test and Development Chassis

May 30, 2003 11:38 am | Product Releases | Comments

Tracewell announces a test and development chassis for applications using the CompactPCI Serial Mesh Backplane (CSMB) architecture. This fabric architecture enables high speed, high performance data transfer in a variety of applications. The T-Frame™ test and development system is an 8-slot system providing the functionality and control of a development chassis with fully compliant Serial Mess Backplane, and the added benefit of open ac...

LISTED UNDER: Services, Calibration / Test

Probes and Test Accessories

May 1, 2003 11:25 am | Product Releases | Comments

These fused probes and test accessories are featured in Fused Probe Test Kits, specialized probes, DMM test leads, and individual accessories. High quality fast acting ceramic fuses (or customer specific fuses) rated up to 10 amps are located near probe tips. Design features include flexible double insulated silicone leads resistant to corrosive chemicals and high temperatures....

LISTED UNDER: Services, Calibration / Test

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