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Multi-Channel PXI-Based Test Solution

Wed, 07/30/2014 - 9:16pm
WDD Staff

Agilent Technologies (Santa Clara, CA) announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which accelerates the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs. The test solution offers:

  • Time-synchronized MIMO testing (2x2 or 4x4).
  • RF M9381A PXIe vector signal generators.
  • M9391A PXIe vector signal analyzers.
  • Provides less than 0.38% EVM and less than 20 nsec time synchronization between channels.
  • Up to 160 MHz signal generation and analysis bandwidth.

For more information, visit www.agilent.com.

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