Product Releases

MIPI M-PHY v3.0 Interface S-Parameter and Impedance Testing Using ENA Network Analyzer

Mon, 06/30/2014 - 9:39am
WDD Staff

Agilent Technologies (Santa Clara, CA) announced the availability of its Method of Implementation (MOI) document for the transmitter/receiver (Tx/Rx) interface S-parameter and impedance tests defined in version 3.0 of the MIPI Alliance Specification for M-PHY. The MOI, and a test package such as a state file, which makes setup and measurement easy, works with the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR). Agilent’s MOI provides engineers with:

  • A measurement guide of procedures for the interface S-parameter.
  • Impedance tests defined in the latest MIPI M-PHY specification.
  • Using the MIPI M-PHY v3.0 MOI and state files, semiconductor and product integrator manufacturers are able to more efficiently perform compliance tests to the standard with the E5071C-TDR.

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