MIPI M-PHY v3.0 Interface S-Parameter and Impedance Testing Using ENA Network Analyzer
Agilent Technologies (Santa Clara, CA) announced the availability of its Method of Implementation (MOI) document for the transmitter/receiver (Tx/Rx) interface S-parameter and impedance tests defined in version 3.0 of the MIPI Alliance Specification for M-PHY. The MOI, and a test package such as a state file, which makes setup and measurement easy, works with the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR). Agilent’s MOI provides engineers with:
- A measurement guide of procedures for the interface S-parameter.
- Impedance tests defined in the latest MIPI M-PHY specification.
- Using the MIPI M-PHY v3.0 MOI and state files, semiconductor and product integrator manufacturers are able to more efficiently perform compliance tests to the standard with the E5071C-TDR.
For more information, visit www.agilent.com.