Agilent’s Next-Gen System for Measuring Flicker Noise
Agilent Technologies (Santa Clara, CA) has introduced the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN). Agilent’s newest Advanced Low-Frequency Noise Analyzer:
- Features a unique modular design, which allows it to minimize system noise.
- Provides measurement capabilities at an ultra-low frequency.
- Offers high-voltage/high-current handling capabilities.
For more information visit www.agilent.com/find/eesof.