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Agilent’s Next-Gen System for Measuring Flicker Noise

Tue, 04/29/2014 - 3:53pm
WDD Staff

Agilent Technologies (Santa Clara, CA) has introduced the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN). Agilent’s newest Advanced Low-Frequency Noise Analyzer:

  • Features a unique modular design, which allows it to minimize system noise.
  • Provides measurement capabilities at an ultra-low frequency.
  • Offers high-voltage/high-current handling capabilities.

For more information visit www.agilent.com/find/eesof.

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