Product Releases

Ultra-compact R&S TSME Drive Test Scanner

Tue, 02/25/2014 - 6:34pm
WDD Staff

At Mobile World Congress 2014, Rohde & Schwarz (Munich, Germany) will showcase the R&S TSME – a new, ultra-compact drive test scanner for today and tomorrow’s wireless communications standards and frequency bands. Measuring 151 mm x 47 mm x 93 mm and weighing just 650 g, it is not only much smaller and lighter than competing devices, it also consumes very little power, making it the ideal solution for testing the quality of communications channels in the field as well as inside buildings where high data traffic presents a difficult set of problems. Features include:

  • 350 MHz to 4.4 GHz measurement bandwidth.
  • Coverage of all bands specified for wireless communications technologies.
  • Simultaneous measurement capability of any combination of technologies in each band.

For more information, visit


Share this Story

You may login with either your assigned username or your e-mail address.
The password field is case sensitive.