Product Releases

IAR Systems' I-Scope Probe

Thu, 04/25/2013 - 10:14am
WDD Staff

IAR Systems (San Jose, CA) is now offering the latest addition to its innovative Power Debugging technology. The I-scope probe extends the power optimization possibilities available in IAR Embedded Workbench. Used together with IAR Systems’ in-circuit debugging probe I-jet, I-scope lets developers optimize their applications for power consumption and possibly extend battery lifetime by offering them knowledge of the power consumed by individual modules, and detect if design flaws in the code are causing unnecessary power consumption. The I-scope probe:

  • Incorporates in the C-SPY Debugger included with IAR Embedded Workbench.
  • Can measure current and voltage with 12-bit resolution @ a sampling rate of up to 200 kHz.
  • Synchronizes data with the running program counter, and graphs it in real time.

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