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Cascade's Flexible On-Wafer Measurement Platform

Mon, 03/18/2013 - 11:18am
WDD Staff

Cascade Microtech, Inc. (Beaverton, OR) [NASDAQ: CSCD] has announced the CM300, a flexible on-wafer measurement platform that scales to meet evolving needs in capability and automation. It enhances device and process characterization and modeling by capturing the true electrical performance of devices and enabling hands-off productivity. Features include:

  • High-accuracy measurements that deliver reliable data, reducing design iterations, costs, and time-to-market.
  • Measurement automation, including the ability to reduce idle time while testing over a wide span of temperatures, and test automation using Velox software.
  • A new Velox probe station control software.
  • Fast and well-characterized thermal transition and probe-to-pad alignment.

For more information visit www.cascademicrotech.com.

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