Amphenol's H4 Solar Connector Offers Stamped and Formed Contact Option
Amphenol Industrial Global Operations now offers a low cost stamped and formed contact option for its H4 solar connector, complementing the already existing machined contact. These low cost contacts are ideal for use in large scale PV installations as well as with 1000V PV modules. All H4 connectors, regardless of contact type, are the only field installable PV connectors approved by UL for use up to 1000V on the market.
Martin Booker, general manager of Amphenol Industrial Global Operations, said, "Field installable PV connectors from other manufacturers are only rated to 600V by UL. Our H4 connectors, whether stamped and formed or machined, are UL-rated to 1000V. This is a huge advantage in markets where UL is recognized as the standard for safety and performance."
Booker continued, "As the industry shifts, large PV installations in North America are being designed to 1000V and should only use connectors approved to UL 1000V, making our connector ideal for these applications."
The stringent UL6703 1000V testing includes performance after temperature cycling (-40ºC to 90ºC) and humidity freeze (85 ºC/85% relative humidity to -40ºC). Amphenol's H4 connector also meets the IEC 1000V standard.
Amphenol's UL-rated H4 connector can be used in existing systems as well as in new ones that require more voltage without having to increase cable size. The dual-rated (UL/TUV) PV connector features Amphenol's RADSOK technology, offering higher current carrying capacity and lower contact resistance, resulting in lower power loss and improved reliability.
The RoHS-compliant, CSA approved connector also meets NEC 2008 requirements without the need for extra locking collars or locking sleeves. The H4 uses a simple unlocking tool for easy unmating in the field. H4 connectors are also available in a version designed for easy panel mounting to combiner boxes, micro-inverters and DC optimizers.
Contact Amphenol Industrial Global Operations for pricing.
Posted by Sara Cohen, Editorial Intern
June 18, 2012