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Agilent Software Automates STMicroelectronics' Device Modeling On-Wafer Measurements

Tue, 11/16/2010 - 6:00am
Agilent Technologies Inc. recently announced that its IC-CAP Wafer Professional (WaferPro) software has been successfully deployed at STMicroelectronics. WaferPro adds new capabilities to Agilent’s Integrated Circuit and Analysis Program (IC-CAP) software platform to enable efficient, automated on-wafer measurements for device modeling applications.

STMicroelectronics uses IC-CAP as a device modeling platform to extract semiconductor device models for silicon devices (CMOS and BJT, for example). The company will now use IC-CAP WaferPro to conduct all on-wafer automated measurements.

IC-CAP WaferPro allows users to control semiautomatic and fully automatic wafer probe stations and execute DC, CV and RF measurements. It automates spot and swept measurements across a range of temperatures. Wafer realignment is handled automatically at each temperature change, removing the need for engineers to supervise measurements.

Test plans can run automatically at different measurement stations, with different hardware, allowing maximum utilization of lab equipment. Built on a sophisticated architecture, WaferPro also enables efficient data analysis and processing and provides a foundation for future advanced modeling tasks, such as statistical analysis and modeling.

WaferPro is distributed with Agilent’s recently released IC-CAP 2010.08 software.

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