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4G LTE YellowFin Analyzer Offers Advanced Measurement Features

Wed, 10/06/2010 - 11:37am
Berkeley Varitronics Systems, Inc. (BVS) announces the release of their 4G LTE YellowFin analyzer. The LTE YellowFin will allow field engineers to measure the RF integrity with advanced measurements such as RSSI (Received Signal Strength Indicator), CINR (Carrier to Interference plus Noise Ratio), Multipath as well as demodulating the LTE physical layer. The test tool also has full spectrum analysis capabilities in two available models covering 2.0 to 5.9 GHz or 700 to 2.0 GHz. This allows the RF engineers to verify the environment has minimal interference before fully deploying the wireless infrastructure.

This year, IDC, a leading industry research firm predicted a 32% compound annual growth rate (CAGR) for global mobile broadband connections, and LTE was forecast to have a CAGR of 471%. Their analysts also noted 2012 as the tipping point for LTE mass adoption.

BVS will be showcasing the LTE YellowFin at the 4G World Show in Chicago, October 19 – 21. The company will be located in Booth 213, McCormick Place West, Exhibit Hall F1. Anyone planning to attend the event and wishing to observe a live demonstration should email the BVS media contact listed at the end of this announcement.

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