Semiconductor Parametric Analysis and Testing
Tue, 11/20/2007 - 5:30am
Keithley Instruments, Inc. announces the addition of its models 2635 and 2636 to its Series 2600 SourceMeter Instruments for semiconductor parametric analysis and testing. The two models represent a way of doing parametric analysis at fine resolutions of 1fa (10 to 15A) which is often required for many semiconductor, optoelectronic and nanotechnology devices. With their Test Script Processor (TSP) and TSP-Link intercommunications bus, these instruments enable engineers to create fast test systems that are suitable for research, characterization, wafer sort, reliability and production monitoring. Each includes a PC-like microprocessor to allow easy programming and independent execution of test programs (scripts) ranging from the simple to complex including sourcing, measuring, test sequence flow control and decisions with conditional program branching.