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Joint Effort Helps Engineers Easily Create Integrated Test and Measurement Solutions

Tue, 10/23/2007 - 7:51am
National Instruments and Anritsu Company announce a joint effort to develop LabVIEW Plug and Play and LabWindows/CVI instrument drivers for Anritsu test instruments. The companies are working together to make it easy for engineers and scientists to combine the popular LabVIEW graphical development platform and the proven LabWindows/CVI ANSI C integrated development environment with Anritsu RF and wireless communications test instruments.

"Because many of our customers take advantage of the easy-to-use LabVIEW and LabWindows/CVI environments to automate their test and measurement applications, the availability of these drivers is a key factor in our customers' adoption of Anritsu instruments," said Donn Mulder, vice president and general manager of the Microwave Measurements Division of Anritsu Company. "Through this collaborative effort with National Instruments, we are providing our customers with access to high-quality drivers so they can save significant time and money developing their automated test systems."
To date, National Instruments and Anritsu have collaborated on LabVIEW and LabWindows/CVI drivers for several Anritsu products, such as the VNA Master™ MS2024A/MS2026A, MS2034 and MS2036A Handheld Vector Network Analyzers; the MS271xB series of Economy Microwave Spectrum Analyzers; the MT8860B WLAN Test Sets; and the MT8852B Bluetooth Test Sets with enhanced data rate (EDR). These drivers, which make it easy for engineers and scientists to quickly connect and control their instruments from the desktop or benchtop, are available for free download at the NI Instrument Driver Network at www.ni.com/idnet.

www.ni.com
888-280-7645
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