DAC/ADC Switch Matrix
Wed, 10/17/2007 - 6:36am
Renaissance Electronics introduces its Model 18A1NAG DAC/ADC switch matrix that supports a high level of integration during qualification testing for digital and analog assemblies operating at microwave frequencies. This RF switch matrix, within the test set-up, allows for multiple channel testing with minimal test equipment resources. It will route the input signal source and outputs of the DUTs to the communications analyzer for eye diagram measurements as well as a Bit Error Rate (BER) test. The approach allows for maximum use of test instruments and full coverage of DUTs without manually hooking and unhooking cables. The separate analog and digital USB control ports, combined with software, allows for the development of a complete automatic test program (ATP) to verify and measure all possible paths.