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Semiautomatic Probe System

Fri, 09/02/2005 - 7:32am

SUSS MicroTec AG introduces the BlueRay Semiautomatic Wafer Probe System. With the BlueRay's z-axis accuracy, it is now possible to be fully confident in test results from both wafers and other substrates. The BlueRay's precision guarantees a safe, repeatable electric contact with the device under test (DUT), which reduces pad damage and eliminates the need for probe mark inspection.


Suss MicroTec AG


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