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Automated Test Solution

Thu, 12/16/2004 - 6:38am

Agilent introduces an automated test solution for functional, at-speed test that reduces the cost of testing high-speed, system-on-a-chip (SOC) devices to the lowest in the industry. Part of the Agilent 93000 SOC Series, this complete high-speed I/O solution enables functional testing of high-pin-count devices, such as next-generation PC chipsets up to speeds of 3.6 Gb/s. The solution is enabled by Agilent's Pin Scale 3600 Digital Card, which offers per-pin scalability from 800 Mb/s to 3.6 Gb/s, allowing the test system to be configured to match device requirements, pin by pin. With up to eight independent clock domains, the Agilent 93000 SOC Series can satisfy complex timing needs for concurrent at-speed testing of multiple buses running at non-friendly speed ratios (bus fractions).

Agilent Technologies Inc.

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