Mon, 11/24/2003 - 7:19am
Aries introduces a high frequency test socket for devices from 14 to 27 mm2 wide. The socket is suited for manual testing of devices with pitches down to 0.50 mm, in applications with speeds from 1 GHz to over 10 GHz. A 4-point spring probe crown on the socket ensures scrub on solder ball oxides for reliable contact mating. With a signal path of .077 inches, the socket provides minimal signal loss for high bandwidth capability. Center probe contact forces are 9 g to 12 g per contact for 0.50 mm to 0.75 mm pitches, and 17 g to 20 g per contact for 0.80 mm pitches and larger. The test socket's operating temperature is 55°C to 150°C.