Advertisement
Product Releases
Advertisement

On-Wafer Test Solution

Wed, 07/30/2003 - 9:51am

Cascade Microtech announces a fully integrated on-wafer device characterization solution that provides measurement accuracy and high performance for characterizing semiconductor devices to 110 GHz. This solution enables high-precision measurements up to 110 GHz by combining the Agilent N5250A 110 GHz PNA series network analyzer with Cascade's Summit series of analytical probing systems. Cascade's probing system expands device characterization by providing: Infinity probes to 110 GHz; 150 mm, 200 mm or 300 mm on-wafer probing system with MicroChamber; thermally isolated auxiliary chuck that ensures that the accuracy and integrity of the calibration is maintained over-temperature; verified millimeter-wave calibration standards; WinCal Calibration Software; Wavevue Measurement Studio measurement application software.

www.cascademicrotech.com; (800) 550-3279

Advertisement

Share this Story

X
You may login with either your assigned username or your e-mail address.
The password field is case sensitive.
Loading