Fri, 05/30/2003 - 11:38am
Cascade Microtech announces an RF multi-device test production probe card, the Pyramid Probe Card. The probe card allows wafer testing of multiple RF semiconductor wafers in production simultaneously. Pyramid Probe Cards are compatible with all brands of RF ATE equipment. Cascade Microtech's thin-film process, used to fabricate the probe cards, preserves the signal integrity of the RF lines that are being tested on multiple devices.
www.cascademicrotech.com; (800) 550-3279