Product Releases

Linear Device Tester

Mon, 12/02/2002 - 9:56am

The IC443is a simple-to-use and easy-to-program bench top ICT optimized for 100% testing of linear devices and interfaces directly with handlers and probers for high throughput wafer probing or final assembly testing. The system's low cost, fast set up and simple fill-in-programming make it an ideal tool for high volume production test, incoming sample inspection, and in-depth design verification. Size is 24 inchesD × 22 inchesH × 20 inchesW. The test head is the size of a shoe box, measuring 6 inchesD × 3 inchesH × 10 inchesW, and is easily attached to probers and handlers. Other advanced features of the IC443 include a slew rate window comparator, a precision sine wave generator, and a 16-bit setting and measurement accuracy. Additionally, each analog pin has a precision 4-quadrant VI-source with programmable compliances delivering high precision testing of operational amplifiers or comparators.


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