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Probing Solution

Fri, 09/27/2002 - 6:44am
Cascade Microtech's S300 Semiautomatic Probing Solution for 300 mm wafers, combined with Agilent's 4294A, provides unmatched productivity and accuracy for advanced CV analysis of deep submicron semiconductors to 110 MHz. Key system features include: off-wafer, thermally isolated, SOL calibration standards, off-wafer system reference capacitors, and high-frequency probes and accessories.
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