Spring Contact Probes Catalog
Fri, 04/06/2001 - 6:58am
Interconnect Devices Inc. (IDI) announces the publication of the sixth edition of its Catalog and Source Book. The new, sixth edition IDI Catalog and Sourcebook features several new products and product advancements. These include the new ICT Titanium Pro Series the second generation of the in-circuit test probe and High Current and Semiconductor Probes. New Tip Style designs are featured throughout the catalog. An updated and revised sourcebook covering coaxial fixturing and battery contact mounting is also included. The catalog and sourcebook can be found on the IDI's Web Site.