Single Box L-I-V Test Solution
The Model 2520 was designed for production testing of laser diode chips and bars. These components find use as optical sources in optical networks and in optical read/write heads of data storage systems. However, its pulsed current and V-I compliance capabilities make it useful for testing a wide range of electronic devices that must be protected from destructive voltages or self-heating while under test.
The Model 2520 is supplied in a half-rack size box with IEEE-488 and RS-232 interfaces. It allows complete Light Intensity-Current-Voltage (L-I-V) testing without the need for separate current-to-voltage converters, multichannel digital oscilloscopes, "boxcar averagers", or customized software.
The Model 2520 has a 14-bit A/D converter for accurate determination of the laser diode's lasing threshold current, L-I efficiency, and I-V linearity. For users how develop laser diode test applications with LabWindows CVI and LabVIEW, instrument drivers for these packages can be downloaded from the Keithley website.