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Integrated Multimeter/Switching System

Fri, 04/06/2001 - 5:20am
Keithley Instruments, Inc. announced its new Model 2750 Multimeter/Switching System, with a combination of channel count, cost per channel, and system performance that surpasses all other single-box measurement and control systems. This latest addition to the Keithley Integra Series has new mainframe features and plug-in module options that provide precision measurement and control in a single, highly integrated enclosure for either rack mounting or benchtop use. The Model 2750 mainframe combines five expansion slots and a growing family of 9 plug-in modules, and a 14-function 6 - digit DMM (with MIST traceable accuracy), allowing up to 200 channels of 2-pole (differential) switching and multichannel analog/digital I/O. The model 2750 is an affordable, high-performance alternative to separate DMMs and switch systems, dataloggers/recorders, VXI/PXI systems, and plug-in card data acquisition equipment.

Along with the Model 2750 mainframe, Keithley introduced three new plug-in modules: the Model 7709 6 x 8 Matrix Switch module, Model 7707 Multiplexer-Digital I/O module, and the Model 7701 32-Channel Multiplexer module. A total of nine different analog and digital I/O modules can be used with the Model 2750 to create highly flexible and cost-effective test platforms.

Hardware and software features simplify set-up and use of a Model 2750 system. For example, the D-shell connector kits save installation and maintenance costs by allowing fast, mass terminations to multiplexer modules with a ribbon cable. LabVIEW®, LabWINDOWS/CVI® and TestPoint™ drivers speed test application development.

With its tightly integrated DMM and switch system, the Model 2750 allows scan rates of more than 200 channels/second (up to 2500 readings/second), thereby reducing test times and increasing productivity. Moreover, the flexibility of its features and functions allows the Model 2750 to serve a wide range of industries and applications, such as production testing of electronic components, subassemblies and systems; accelerated stress testing, including HALT/HASS, ESS, and burn-in; process monitoring and control; and precision low-ohms measurements.

Because resistance testing is often required in electrically noisy production environments, the Model 2750 was designed for measurements from micro-ohms to megohms using the offset compensation method. By expanding the measurement ranges, the Model 2750 can address applications normally reserved for more expensive and complex micro-ohm meters. This makes the Model 2750 an ideal choice when performing mission-critical or micro-ohm measurements on connectors, harnesses, airbag squibs, sensors, semiconductors, or other low-ohm devices. Also, a built-in 20 mV clamp protects sensitive DUTs form voltage breakdown during ohms measurements and enables "dry circuit" testing that prevents metal oxide breakdown on electrical contacts.

Built in signal conditioning on the Model 2750 mainframe can handle inputs up to 1000V/3A(300V/1A with the plug-in modules). The five expansion slots and nine different input modules provide the flexibility to vary channel count from 20 to 400 (single-ended), apply a stimulus to devices under test (DUTs), route signals, control system components, and make measurements with 14 different DMM functions. Robust digital I/O on the input modules can be used for triggering the Model 2750, handshaking with other automation equipment and providing alarm limit outputs. High performance features on the mainframe, such as per-channel programmable scan lists, a 110,000 point memory buffer, built-in signal conditioning and scaling, and several math functions enable the user to optimize system throughput in many automated test applications. Communication with a PC can be through either a GPIB or RS-232 interface.

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