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Rohde & Schwarz' Compact RF Test Solution

November 6, 2013 10:48 am | by WDD Staff | Product Releases | Comments

Rohde & Schwarz has enhanced its R&S CMW500 wideband radio communication tester with new options for RF tests and end-to-end testing of LTE-Advanced carrier aggregation. This one-box solution on the market allows RF tests with two component carriers in the...

LISTED UNDER: Test and Measurement, Other

Agilent Extends Frequency Range of MXE EMI Receiver

November 5, 2013 12:07 pm | by WDD Staff | Product Releases | Comments

Agilent Technologies has announced two new options for its MXE X-Series electromagnetic interference receiver: 44-GHz frequency range and...

LISTED UNDER: Receivers, Other | Test and Measurement, Other | Test and Measurement, Analyzers, Other

Real-Time Analysis Accelerates Wireless Development

October 16, 2013 5:23 pm | by WDD Staff | Product Releases | Comments

Today's complex, signal-rich systems and environments are challenging for RF engineers who are trying to bring advanced products to market quickly. Learn the strengths of using real-time spectrum analysis to measure the agile signals and sophisticated modulation schemes used in wireless.

LISTED UNDER: Test and Measurement, Other
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Agilent Technologies Offers More Bandwidth on New Oscilloscope

October 16, 2013 4:37 pm | by WDD Staff | Product Releases | Comments

Agilent Technologies recently announced a limited-time promotion that offers customers more bandwidth at no extra cost...

LISTED UNDER: Components, Other | Oscillators, Other | Test and Measurement, Oscilloscopes

New BinMaster RL for Reliable, Non-Contact Level Measurement in Bins

October 15, 2013 3:57 pm | by WDD Staff | Product Releases | Comments

BinMaster Level Controls introduces the new BinMaster RL level sensor designed to provide highly reliable bin level data in challenging environments where dust levels are extremely high.

LISTED UNDER: Test and Measurement, Other

Teseq Expands CDN Line

October 9, 2013 3:06 pm | by WDD Staff | Product Releases | Comments

Teseq has expanded its extensive line of over 60 CDNs (coupling/decoupling networks) for EMC RF conducted immunity testing, according to IEC/EN 61000-4-6, with several new models...

LISTED UNDER: Embedded Systems & Networking | Test and Measurement, Other

Aeroflex Announces the 7215 Configurable Automated Test Set

September 25, 2013 3:53 pm | by WDD Staff | Product Releases | Comments

 Aeroflex has announced the release of the Aeroflex 7215 Configurable Automated Test Set. The 7215 is a complete radio test system designed for production and depot-level testing of military and software-defined radios (SDR).

LISTED UNDER: Test and Measurement, Military / Aerospace

Aeroflex Announces the 3515B Military Portable Radio Test Set with Color Touch-Screen

September 25, 2013 2:59 pm | by WDD Staff | Product Releases | Comments

Aeroflex Incorporated has announced the release of the 3515B Military Portable Radio Test Set featuring a color touch-screen and enhanced specifications to provide users with a lightweight, easy to use, and reliable radio test system.

LISTED UNDER: Test and Measurement, Other
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Anritsu Introduces BTS Master with Improved Performance

September 25, 2013 12:19 pm | by WDD Staff | Product Releases | Comments

Anritsu Company has introduced the MT8220T BTS Master, a multi-function handheld durable tester with all the capabilities network operators, sub-contractors, installers, and regulatory authorities need when measuring base stations.

LISTED UNDER: Test and Measurement, Other

Faster RF Signal Generation and Analysis Improves Manufacturing Test Throughput

September 25, 2013 12:11 pm | by WDD Staff | Product Releases | Comments

Agilent Technologies has introduced the M9391A, a 1-MHz to 3- or 6-GHz PXIe vector signal analyzer, with up to 160-MHz bandwidth designed to test the latest wireless standards. Used in combination with Agilent’s modular X-series applications, the M9391A delivers a consistent user interface and common measurement consistency.

LISTED UNDER: Test and Measurement, Analyzers, Vector

Battery Free Full System from Farsens

September 25, 2013 11:44 am | by WDD Staff | Product Releases | Comments

Easy to set-up, complete wireless battery free sensor systems are now available for testing

LISTED UNDER: Power, Batteries | Power, Other | Test and Measurement, Other

Richardson RFPD Introduces Two New High Frequency UltraCMOS SPDT RF Switches from Peregrine

September 25, 2013 8:58 am | by WDD Staff | Product Releases | Comments

Richardson RFPD has announced two new RF single-pole, double-throw (SPDT) switches from Peregrine Semiconductor Corporation (Peregrine). The new switches operate from 9 kHz to 13 GHz and feature high power handling, making them ideally-suited for a range of high frequency wideband applications, including test and measurement, automatic test equipment (ATE), wireless backhaul, and aerospace and defense.

LISTED UNDER: Switches, IC | Test and Measurement, Other

Agilent Technologies Introduces New Portable Logic Analyzers

September 19, 2013 3:16 pm | by WDD Staff | Product Releases | Comments

Agilent Technologies has introduced its 16850 Series portable logic analyzers. The instruments offer the industry’s fastest timing capture with deep memory for quickly debugging digital systems.

LISTED UNDER: Test and Measurement, Analyzers, Other

Anritsu MD8430A LTE Network Simulator

September 18, 2013 11:56 am | by WDD Staff | Product Releases | Comments

Anritsu introduces software enhancements to its MD8430A Signaling Tester that make it the first LTE network simulator to support Time Division Duplex LTE (TD-LTE) Carrier Aggregation (CA) test functionality.

LISTED UNDER: Digital Hardware, Other | Test and Measurement, Signal Generators

Pico Technology Adds High-Performance PC Oscilloscopes

September 17, 2013 3:12 pm | by WDD Staff | Product Releases | Comments

With up to 500 MHz bandwidth on four channels, and an industry-leading 2 G samples of buffer memory, the new PicoScope 6000 Series from Pico Technology has both the performance and the advanced analysis capability to speed debug of today’s complex electronic designs.

LISTED UNDER: Test and Measurement, Oscilloscopes

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