Agilent Technologies to Attend International Microwave Symposium
SANTA CLARA, Calif., May 21, 2014 Agilent Technologies Inc. announced it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.
"This year's event marks 75 years in electronic measurement for Agilent," said the company's Barry Alcorn, Americas market segment manager for RF and microwave. "We also look ahead to our upcoming separation from Agilent to become Keysight Technologies. Our RF and microwave products and solutions, along with our partner solutions, represent the finest in what engineering professionals need to achieve outstanding results in their product design and development."
The Agilent demonstrations will cover everything from circuit-level modeling through system verification for general RF, microwave, millimeter wave for 4G, emerging 5G communications and aerospace/defense.
New capabilities and productivity improvements in ADS 2014 include Automatic EM Simulation Setup and Design Partitioning, New Physical LVS with Device Recognition, Improved Layout Interconnect Design and Editing, New Wireless Verification Test Benches for LTE-A, LTE, 802.11ac and Electrothermal and Thermal Floor-planner simulation in ADS.
Genesys 2014 features breakthrough modulated RF analysis as well as enhancements to its powerful, custom-filter direct synthesis technology.
EMPro provides time- and frequency-domain 3D electromagnetic solvers in a full 3D modeling environment tightly integrated with ADS and Genesys.
In addition, SystemVue system-level design and verification will show the newest features in high-performance design personalities for wireless/4G, radar/EW and next-generation verification (VTB).
Signal Generation and Analysis
The RF power amplifier (PA) automated test solution with envelope tracking capability, built on modular signal generators and analyzers, delivers high test throughput, reduces cost, and allows for rapid integration into a PA test environment with example source code optimized for speed. Leveraging the same user interface and best-in-class measurement IP of the X-Series measurement applications ensures extremely high confidence in measurement results through the entire design and production life cycle.
The M9393A PXIe performance vector signal analyzer can measure signals up to 27 GHz with the speed and accuracy previously unseen in modular instrumentation. It delivers Agilent's proven microwave measurement technology in a PXI form factor for manufacturing and design validation of transmitters and components for radar, military, satellite and commercial wireless communications.
The 89600 VSA software can analyze a variety of wideband millimeter-wave signals, including 802.11ad, 5G and backhaul, utilizing a flexible suite of downconverters, wideband signal analyzers and high-frequency oscilloscopes.
Symposium attendees will learn about cost-effective solutions for noise figure analysis and microwave signal generation, as well as MXA and EXA X-Series signal analyzer enhancements in sensitivity, frequency stability and coverage, and fast power measurements.
Agilent's PXA X-Series signal analyzer and MXG signal generator can characterize and optimize the performance of power amplifiers using envelope tracking and digital predistortion.
Users can experience the powerful enhancements to Agilent's Nonlinear Network Analyzer (NVNA), which provides insight and ease of use for solving complex design problems.
The PNA-network-analyzers-300-khz-to-11-thz?nid=-536902643.0&cc=US&lc=eng">PNA-X, with advance measurement capabilities, enables the most comprehensive single connection characterization of E-Band Tx / Rx components. The PNA's flexible receiver architecture, combined with phase-controlled sources, eliminates baluns and hybrid couplers for measurements of microwave differential and I/Q mixers.
The Physical Layer Test System (PLTS) is the industry-standard signal integrity tool for high-speed digital design. Automatic Fixture Removal (AFR) is the world's easiest way to accurately remove fixture effects from measurements. AFR is also available as an option to PNA, PNA-L and PNA-X Series network analyzers. The same powerful AFR algorithms from PLTS software are now conveniently built into the analyzer's user interface.
The new E5063A ENA Series Network Analyzer, with materials measurement software, provides the perfect balance between price and performance for users' dielectric measurement needs.
Peak Power Analysis
See Agilent's full range of solutions for power measurements.
Handheld RF/uW Tools
FieldFox combines a spectrum analyzer, vector network, analyzer, power meter, independent CW source and other RF/MW functionalities in a rugged, lightweight package. It is the ideal field test tool for RADAR, SATCOM, military and commercial communication systems.
For more information, visit www.agilent.com.