AVX to Present 'Commercial Vs Hi-rel Qualification Method Comparison' at MRQW 2013
AVX presentation will address the differences between commercial & hi-rel capacitor design, processing, & qualification
GREENVILLE, S.C. (December 6, 2013) – AVX will deliver a presentation entitled “Commercial vs. Hi-Rel Qualification Method Comparison” at the 2013 Microelectronics Reliability & Qualification Working Meeting (MRQW). A forum for the open discussion of reliability and qualification issues for microelectronics intended for use in space systems, MRQW 2013 will take place December 10-11, 2013 at The Aerospace Corporation in El Segundo, Calif.
Presenting “Commercial vs. Hi-Rel Qualification Method Comparison” at 10:30am on Tuesday, December 10, 2013, AVX Fellow Ron Demcko will address the differences between commercial and high-reliability capacitor design, processing, and qualification for space systems. Demcko will also provide attendees with updated information about base metal electrode (BME) testing and reliability for an array of capacitors with varying case sizes, voltages, and values, which will support the recent European Space Agency (ESA) decision to allow the companies responsible for building its space systems to purchase and employ high-reliability BME capacitors from AVX in their designs.
BME technology enables the development of high-reliability capacitors capable of exhibiting an enormous range of capacitance values in an extremely compact physical case. Since the technology’s introduction approximately 20 years ago, companies like AVX –the current leader in BME reliability– have optimized BME dielectrics, metals, and processing, successfully creating BME components that are just as reliable as precious metal electrode (PME) components.
For more information, visit www.avx.com