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Agilent’s Award-Winning, Ultrafast Express Test Now Compatible with All G200 Stages and DCM II, XP Heads

Mon, 12/09/2013 - 12:49pm
Agilent Technologies

SANTA CLARA, Calif., Dec. 3, 2013 – Agilent Technologies announced that its high-speed Express Test option, a recent recipient of the prestigious R&D 100 Award, is compatible with all Nano Indenter G200 stages and DCM II and XP heads. Innovative Express Test technology enables the world’s fastest nanoindentation for mechanical-properties mapping.
 
Designed and optimized for exclusive use with Agilent’s popular Nano Indenter G200, Express Test delivers high-precision data on a wide variety of materials. Methods enabled by Express Test are ideal for instrumented indentation applications involving metals, glasses, ceramics, structural polymers, thin films and low-k materials. Express Test allows up to 100 indents to be performed at 100 different surface sites in 100 seconds.
 
In addition to offering researchers working in scientific and industrial settings unprecedented speed, Agilent Express Test affords remarkable versatility and ease of use. Express Test enables the Nano Indenter G200 to be operated in controlled-force or controlled-displacement mode. Testing is simple: Just point and shoot.
 
With Express Test, area-function calibration can be performed in minutes, Young’s modulus and hardness can be rapidly evaluated with robust statistics, and quantitative maps of mechanical properties can be generated in record time. Agilent’s premier-performance NanoSuite software lets users automatically generate histograms and 3D mechanical-properties maps. Graphs and supporting data are easily exported to Microsoft Excel.

For more information, visit www.agilent.com

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