Agilent to Demonstrate Test and Characterization Tools at OFC/NFOEC
Driven by new cloud-based and mobile services and an increasing number of large-scale data centers, the demand for more bandwidth at lower power consumption continues to escalate. Advanced modulation formats are being deployed in long-haul and metro telecommunication systems, and data streams are being standardized to fill the new 100-G pipes.
"Researchers and transmission system designers will enjoy seeing 32-QAM dual-polarization modulation testing at 28 Gbaud," said Juergen Beck, general manager of Agilent's Digital and Photonic Test Division. "Plus, development and manufacturing engineers working with next-generation optical components and signals for systems at 40/100 G will be able to see our fast and accurate component-characterization and signal-analysis solutions. These solutions help reduce OPEX and CAPEX by speeding up component testing."
Visit Agilent at Booth 1201 to see:
Solutions for Datacom Networks and Cloud Computing
With 10-GbE/28-G/40-G and 100-GbE tributaries for high-capacity links driving test needs for enterprise networks and high-speed computing, Agilent will demonstrate:
- Waveform analysis test solutions for research, design validation and manufacturing.
- Stressed-eye test solutions for optical receivers up to 28 G.
Solutions for Metro/Transport Networks
With complex modulation driving system and component test needs in the metro/transport network, Agilent will demonstrate:
- Research test solutions for coherent transmission systems.
- Test solutions for active and passive components used in coherent receivers.
For more information, please visit www.agilent.com.
Posted by Ron M. Seidel, Editorial Intern
February 29, 2012