Agilent Technologies to Launch Modular Automotive Functional Test Solution, Demonstrate In-circuit Test Applications

Fri, 04/08/2011 - 6:51am
Agilent Technologies Inc. will unveil its new modular PXI-based TS-8900 automotive functional test system at the IPC APEX EXPO in Las Vegas next week. The test system provides a standard platform - with 20 percent higher throughput - for manufacturers of medium- to high-pin-count electronic control units.

The system includes a high-channel-count voltage acquisition module; a large voltage-current range source; a high-voltage and channel digital-to-analog converter, enabling parallel test methodologies; and 200 automotive applications-tuned libraries for faster deployment.

Other key products Agilent will show at the expo include:

* The Medalist i3070 Series 5 in-circuit test (ICT) system, with breakthrough ICT inspection of LEDs and high-power testing capabilities.

* The Agilent Test Coverage Consultant, an intelligent predictive tool that analyzes circuits with Agilent’s ICT technologies to help optimize the user’s test strategy.

* New applications of Agilent?s low-cost Medalist i1000D ICT, with an integrated board handler for smart phone, LED, automotive fuse box and limited access tests.

The IPC APEX EXPO will take place April 12-14 at the Mandalay Bay Resort and Convention Center in Las Vegas, Nev. Agilent will be in Booth 1473.

Additional information is available at, and


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