Mon, 06/06/2005 - 12:02pm
Keithley releases an interactive, tutorial CD on reliability testing for semiconductor test engineers. "Understanding Measurements: Essential Reliability Testing Techniques" provides information related to stress measure testing of semiconductor devices, new measurement techniques and how to improve test throughput and maintain data integrity. The CD, which is the second in Keithley’s series of Test and Measurement Knowledge CDs, is available free of charge. The CD contains three web seminars that discuss a variety of testing issues in detail, including: Understanding reliability testing of semiconductor devices; New measurement techniques for improving semiconductor device reliability; How to improve throughput and data integrity reliability issues and test challenges with gate oxide scaling. Other material on the CD includes: tutorial white papers covering issues related to materials testing and electromigration testing; several product application notes that describe methods for conducting a wide range of semiconductor device tests, including charge pumping, oxide reliability, resistivity, hall voltage measurements, gate dielectric capacitance-voltage characterization and high resistance measurements; useful resources that include a glossary, a guide for choosing the best semiconductor reliability tool for test applications and related web links. Keithley Instruments, Inc.