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A/D Converter Provides Twice the Sample Rate for Wireless Communications



Texas Instruments introduces an ADC that combines 12 bits of resolution with a 1-GS/S sampling rate, effectively doubling the amount of signal bandwidth that can be captured in a single ADC. The ADS5400 offers an unmatched signal-to-noise ratio (SNR) of 59 dBFS and 75 dBc spurious-free dynamic range (SFDR) in first Nyquist, and 58 dBFS SNR and 70 dBc SFDR performance for intermediate frequencies (IFs) beyond 1000 MHz. A fully buffered analog input isolates the onboard sample and hold's internal switching to prevent disturbing the signal source, while providing a high-impedance input. The ADS5400's performance enables designers to create smaller, higher-performance and higher-density wide-bandwidth receivers and digitizers. Developed on TI's high-speed, proprietary BiCom3 complementary bipolar SiGe technology, the monolithic ADS5400 is specified over the full industrial temperature range (-40°C to 85°C). "The ADS5400 has enabled our latest modular component, the QuiXilica Atlas-V5 VXS board, to handle 12 GB/s of data and generate a real-time result," comments Andrew Reddig, Tekmicro's president and chief technology officer. The BiCom3 technology's silicon-on-insulator (SOI) process makes it well suited for high-temperature and high-radiation environments.

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Texas Instruments
http://www.ti.com

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