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TREK, INC. announces the Model 325 electrostatic voltmeter, an ultra-sensitive instrument which is suited for noncontacting electrostatic voltage measurement and monitoring in applications within high-tech, semiconductor, materials processing, materials science and R&D sectors. This versatile instrument was specifically designed to be used in applications which require accurate, low-noise, noncontacting measurement of electrostatic voltages from millivolts to 䕌 V over a wide range of probe-to-surface distances. In high-tech manufacturing, applications include electrostatic monitoring of devices sensitive to electrostatic discharge (ESD), and testing of the reliability and characteristics of dielectric materials and films in electronic applications. In semiconductors, Model 325 is designed to measure the surface potential of bare or processed wafers to analyze doping and thin film characteristics.

TREK Inc.