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Virage Logic Corporation’s Self-Test and Repair (STAR) Memory System now includes capabilities to address the challenges of advanced design and process technologies. A dashboard of user-selectable options enables tradeoffs between test time, area, and state-of-the-art diagnostics for optimal design complexity management. The memory system also features the STAR™Yield Accelerator, created to boost silicon yield and accelerate time-to-volume. The accelerator bridges the design and manufacturing disciplines to enable automated test vector generation, silicon analysis, fault isolation and classification to be used at the critical semiconductor tape-out, bring-up and volume manufacturing stages. It addresses the requirements of integrated device manufacturers (IDM), fabless and foundry customers to rapidly, cost-effectively and accurately identify, analyze, isolate and classify memory faults as designs are readied for transition from first silicon to volume manufacturing. For the first time, the STAR Memory System will be open to enable licensees to use the systems’ capabilities with other commercially available and internally developed embedded memories.


www.viragelogic.com
877-360-6690

Virage Logic Corp.
http://www.viragelogic.com