Identify and discuss problems and challenges in making RF and DC/CV
measurements. Learn how these can be overcome to ensure absolute
confidence in your results.
Seminar Agenda:
8 - 8:30 a.m.
Continental Breakfast & Registration
8:30 - 9:30 a.m.
Making Matching Measurements for Use in IC Design
Bill Verzi, Agilent Technologies
• Matching terminology and applications
• Matching requirements for different device types
• Methods to minimize or eliminate measurement error
• Techniques to extend measurement accuracy beyond published specs
• Tips for effective matching characterization
9:30 - 10:30 a.m.
Parallel Parametric Reliability
Louis Solis, Agilent Technologies
• Limitations of current reliability testing solutions
• Reliability algorithms required by modern processes
• Parallel Parametric Reliability: Features and Benefits
• Case studies and measurement results
10:45 - 11:45 a.m.
Increasing On-wafer IV Measurement Speed & Accuracy Using Agilent 4156C
& E5270 Series Parametric Measurement Solutions
Terry Burcham, Cascade Microtech
• Fundamentals of guarding and shielding techniques
• Impact of residual capacitance on speed and accuracy
• Methods to evaluate the IV measurement system
Noon - 1 p.m.
Lunch and Product Fair
1 - 2 p.m.
Optimizing On-wafer CV Measurements Using Agilent 4284A and 4294A
Terry Burcham, Cascade Microtech
• Fundamentals of capacitance measurements
• Optimizing the test configurations
• Correlation of measurements
2:15 - 3:15 p.m.
Improving On-wafer S-parameter Calibration & Accuracy Using Agilent PNA
Series Vector Network Analyzers
Terry Burcham, Cascade Microtech
• Fundamentals of calibration methods
• Verification of calibrations
• Troubleshooting techniques
Limited to the first 40 registrants!
Contact Junko Nakaya at Cascade Microtech.
Phone: 503-601-1180
FAX: 503-601-1601
Email: Junko_Nakaya@cmicro.com
Wireless Design & Development
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