Advertisement
The Source on Design and Technology for the Wireless and RF Engineer
Subscribe to Wireless Design and Development All
View Sample

FREE WDD Email Newsletter

Microwave Components Catalog

June 6, 2005 12:02 pm | News | Comments

This CD catalog contains over 2000 pages of Miteq's component product lines including amplifiers, IF signal processing and microwave control products, mixers and low noise receiver front ends, fiber optic products, frequency multipliers, frequency generation products, passive power components, integrated microwave assemblies and communication systems.

TOPICS:

Software Development Book

June 6, 2005 12:02 pm | News | Comments

Elsevier announces a book by Robert Oshana, Engineering Manager for Texas Instruments, titled DSP Software Development Techniques for Embedded and Real-Time Systems . This introduction to DSP software development for embedded and real-time developers shows how to use digital signal processors efficiently in embedded and real-time systems.

RF Engineering

June 6, 2005 12:02 pm | News | Comments

RF Engineering for Wireless Networks is written by Daniel Dobkin, Ph. D of WJ Communications. Released by Elsevier, it is a comprehensive, single-volume reference to RF (radio frequency) engineering principles that covers all common wireless networks, including WiFi, WiMAX and Bluetooth. It covers the spectrum of wireless network issues, beginning with the basics of electromagnetic theory (including necessary mathematics), and moving through signal propagation and different modulation methods.

Advertisement

RFIC/MMIC Designer’s Catalog

June 6, 2005 12:02 pm | News | Comments

Hittite’s 10th edition Designer’s Guide catalog for 2005 details over 330 products. This publication includes 80 new RFIC and MMIC product data sheets, as well as quality/reliability, application and packaging/layout information in over 2300 pages. Design engineers will find that the guide is organized into SMT packaged, connectorized module and chip component sections.

Short-form Catalog and CD

June 6, 2005 12:02 pm | News | Comments

Aeroflex introduces a short-form catalog and CD. The CD has interactive links for quick and easy access to all of Aeroflex Test Solutions’ product data sheets. The range of products includes solutions for communications test, cellular parametric test, protocol and conformance test, military and avionics test, RF signal generators, PXI modules for RF test, microwave, spectrum and signal analyzers, synthetic test systems, phase noise test systems and more.

TOPICS:

Short-Form Catalog

June 6, 2005 12:02 pm | News | Comments

Pulse announces the Pulse 2005 Short-Form Catalog. The Pulse 2005 Short-Form Catalog features Pulse’s product offerings from the worldwide telecom, LAN, power, military/aerospace and consumer divisions. New for 2005 are sections on featured products, consumer products and RoHS (Restriction of Hazardous Substances) compliance.

Online Guide

June 6, 2005 12:02 pm | News | Comments

Flomerics introduces a step-by-step guide that integrates thermal and EMC design to help designers identify and resolve system-level electromagnetic compatibility (EMC) issues. This online guide recognizes that most new electronic products fail first-time EMC testing because manufacturers don’t usually evaluate system-level EMC performance prior to the prototype phase.

TOPICS:

Test and Data Acquisition

June 6, 2005 12:02 pm | News | Comments

VXI introduces their 2005 Product Catalog and Engineering Handbook, containing over 200 functional test and data acquisition products. Detailed engineering and application tutorials, encompassing applications such as functional test, signal switching, data acquisition and dynamic signal analysis make this catalog and engineering handbook a valuable reference.

Advertisement

Tutorial CD

June 6, 2005 12:02 pm | News | Comments

Keithley releases an interactive, tutorial CD on reliability testing for semiconductor test engineers. "Understanding Measurements: Essential Reliability Testing Techniques" provides information related to stress measure testing of semiconductor devices, new measurement techniques and how to improve test throughput and maintain data integrity.

Elcoteq Inaugurates a New Plant in India

June 6, 2005 9:25 am | Wireless Design & Development | Product Releases | Comments

Elcoteq Network Corporation inaugurated a new plant in Bangalore, India April 11, 2005. At the same time, Elcoteq became the first global EMS company to manufacture telecommunications equipment in India. When fully operational, Elcoteq’s Bangalore facility will employ approximately 1,000 people and manufacture products for global customers operating in India as well as the Asia-Pacific region....

WEP Cracking

June 2, 2005 12:35 pm | Product Releases | Comments

Glossary of acronyms WEP — Wired Equivalent Privacy SSID — Service Set Identification WPA — Wi-Fi Protected Access WEP is an encryption scheme, based on the RC-4 cipher. It is integrated into 802.11a, b and g wireless products. WEP uses a set of bits called a key to scramble information in the data frames as it leaves the access point or client adapter....

A Simulation Technique for Amplifier Performance Verification

June 2, 2005 12:00 pm | Product Releases | Comments

Spending a few minutes simulating can save days of manually tuning a circuit with lumped components and distributed lines for matching networks. By Anurag Bhargava click the image to enlarge Figure 1, left. Combined layout of input and output circuit of a 5350 MHz ±112....

Multi-Channel Transceivers

June 2, 2005 7:50 am | Product Releases | Comments

Radiometrix introduces VHF and UHF narrow band multi-channel transceivers for low power ISM applications. The SMX series transceivers are compact (53 × 32 × 12 mm) multi-channel narrowband radios intended for a range of industrial wireless data link applications. This family of designs comprises VHF (SMX1: 173 MHz band) and UHF (SMX2: 433 MHz band) units with identical footprint and pinout....

Wireless System On Chip

June 2, 2005 7:50 am | Product Releases | Comments

Zensys announces its second generation chip, the ZW0201. The ZW0201 System on Chip (SoC) is a complete wireless solution consisting of an integrated RF transceiver, an 8051 microcontroller, flash and SRAM memory storage and a range of peripherals. The Z-Wave SoC offers low power consumption; by using an internal wake-up timer, the ZW0201 requires 10% of the power of the Zensys 100 series system....

Inspection Tool

June 2, 2005 7:23 am | Product Releases | Comments

Bede announces the BedeScan™ digital X-ray inspection tool for high-speed identification and quantification of structural defects in semiconductor wafer substrates and epilayers up to 300 mm in diameter. BedeScan uses non-destructive X-ray diffraction (XRD) to identify a range of anomalies in both incoming and processed wafers, including thermal slip dislocations, edge damage and other crystallographic defects....

Pages

X
You may login with either your assigned username or your e-mail address.
The password field is case sensitive.
Loading